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Keysight adds wide-bandgap power semiconductor bare chip dynamic measurement to double-pulse test portfolio
Keysight Technologies Inc of Santa Rosa, CA, USA has enhanced its double-pulse test portfolio, enabling customers to benefit from accurate and easy measurement of the dynamic characteristics of wide-bandgap (WBG) power semiconductor bare chips. The technologies implemented in the measurement fixture minimize parasitics and do not require soldering to the bare chip. The fixtures are compatible with both versions of Keysight’s double-pulse testers...
Categories: Новини світу мікро- та наноелектроніки
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