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Never seen this before

Reddit:Electronics - Tue, 04/07/2026 - 17:27
Never seen this before

10eur keyboard from aliexpress, they really wanted to keep the pcb one layer

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Metasurface enables supersensitive, superfast thermal-based photodetector

EDN Network - Tue, 04/07/2026 - 15:53

I’ve always been interested in sensors and their related electronics. These devices are the interface between the real, physical world and the telemechanical systems that make use of their outputs. It’s also fascinating how many basic sensor approaches have been devised and enhanced for basic parameters such as temperature, pressure, distance, light intensity, and more.

Now we are entering a new phase where advances in materials—especially metamaterials, often aided by lasers—are creating breakthrough in sensors that could not be envisioned or implemented just a few years ago.

In short, a metamaterial is an engineered, 2D structure composed of subwavelength-scale elements that precisely control electromagnetic waves, such as light or microwaves, at an interface. The metasurface is an ultra-thin resonant element with special physical properties.

It’s typically composed of sub-wavelength structures (meta-elements) arranged in a 2D plane, enabling control over the propagation and scattering of electromagnetic waves at sub-wavelength scale by adjusting the phase, amplitude, or polarization of the incident waves

A good example of such an innovation is seen in the thermally based photon-detector project at Duke University, where researchers have demonstrated the fastest pyroelectric photodetector to date. It works by absorbing heat generated by incoming light and can capture light from wavelengths across the electromagnetic spectrum. The ultrathin device requires no external power, operates at room temperature, and can be readily integrated into on-chip applications.

Conventional semiconductor photodetectors work by initiating electron flow when struck by visible light. In contrast, the pyroelectric detector approach (also called a thermal detector) generates electric signals when it’s heated up after absorbing light.

Pyroelectric detectors have been in use for decades due to their wideband characteristic, unlike semiconductor sensors that tend to be narrowband devices (which is not necessarily a bad thing, of course). However, these pyroelectric devices are not as responsive as solid-state devices, since they are relatively bulky and have larger thermal mass.

Although using a thermal scheme is normally slow compared to using photons to stimulate electrical current, it does not have to be that way. In the Duke approach, the metasurface-enabled pyroelectric photodetectors are fabricated by layering a well-established nanogap cavity metasurface structure on top of a pyroelectric thin film (Figure 1).

Figure 1 Schematic representation of metasurface-enabled photodetectors illustrating key dimensions (a) with SEM image of the metasurface absorber (b). The red area represents the metasurface array. Finite element simulations of a single plasmonic nanostructure showing a cross-section of the pyroelectric layer 30 ps after resonant excitation of the metasurface (c).

The metallic metasurface consists of an array of nanoscale silver square prisms (90 nm × 90 nm × 35 nm) separated from a gold film by a thin (10 nm) dielectric layer of Al2O3 (aluminum oxide or alumina).

When light strikes the surface of a nanocube, it excites the silver’s electrons, trapping the light’s energy through a phenomenon known as plasmonics (the interaction between electromagnetic radiation such as light and conduction electrons at metallic-dielectric interfaces), but only at a specific frequency controlled by the nanocubes’ sizes and spacings.

In the latest iteration, the light-absorbing metasurface is circular rather than rectangular to maximize its exposure while minimizing the distance the signal must travel. This phenomenon is so efficient at trapping light and absorbing its energy that it only requires an extremely thin layer of pyroelectric material beneath it to create an electric signal.

Measuring the performance is another challenge. So, they devised an innovative arrangement with two distributed-feedback lasers that “brightened” when their frequencies became close to the same as the device’s operating speed.

The nearly perfect, spectrally selective absorption of the metasurface, which initiates the photodetector response, is shown by white light reflectivity spectra (Figure 2).

Figure 2 White light reflectance spectrum of a detector is shown with a 1.3 × 10−3 mm2 active area of 40 μm diameter (a). Photocurrent responsivity spectra of the detector shown in (a) measured upon pulsed 100 nW light excitation as compared to that of a detector in which a gold film rather than a metasurface layer acts as an absorber (b). Photocurrent measured for the device presented in a) and b) upon pulsed 783 nm excitation at the indicated power with the beam size maintained to consistently have a diameter 5 μm smaller than that of the device (c).

The gold mirror alone efficiently reflects near-infrared light, while the metasurface exhibits a relative decrease (>95%) in reflectivity centered at 790 nm. The resonance wavelength is determined by the size of the Ag nanostructures and the thickness of the Al2O3 dielectric layer, as it allows the possibility of photodetectors that are spectrally selective across the visible and infrared portions of the spectrum.

The team found that their new thermal photodetector operates at record-breaking 3-dB bandwidth of 2.8 GHz, which corresponds to a rise time of just 125 picoseconds. Also important, these ultrafast speeds were achieved while maintaining competitive responsivities and noise equivalent power (NEP) as low as 96 pW/√Hz.

This is just one of the many innovative applications in the RF and optical worlds which leverage metamaterials and metasurfaces. Among many other uses, these materials enable new ways to manage and channel electromagnetic energy at these wavelengths, often to create sensors of extraordinary accuracy and precision.

The full details of this work by the Duke University team are in their paper “Metasurface-Enhanced Thermal Photodetector Operating at Gigahertz Frequencies” published in Advanced Functional Materials. While that posted paper is behind a paywall, the Duke team has thoughtfully posted an open-source version at their departmental website here.

Have you seen or used any sensors based on metamaterials or metasurfaces? What sensing challenges would you tackle if you had the needed meta resources?

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The post Metasurface enables supersensitive, superfast thermal-based photodetector appeared first on EDN.

Boundary scan in combination with automotive applications for CAN-FD and LIN bus

ELE Times - Tue, 04/07/2026 - 15:07

Serial communication remains the backbone of electronic communication in the automotive sector. The cost-effective LIN bus with master-slave architecture and the fast multi-host fieldbus CAN-FD (Controller Area Network) have become established in this field. The great advantage and efficiency of the applications lies in the combination of both bus systems. GÖPEL electronic has now introduced an extension for the SCANFLEX Multi Port Bus I/O Module 9305 for these interfaces, which makes the functional diversity of the SCANFLEX system available for automotive interfaces in production testing.

With the new BAC module for CAN-FD/LIN, these interfaces can now be tested for functionality during production. The Bus Access Cable (BAC) is connected to one of the five slots of the SCANFLEX Multi Port Bus I/O Module 9305 and thus connected to the SCANFLEX system. This enables access to the complex test functions of the SCANFLEX boundary scan controller. The controller then takes over the simultaneous generation and dynamic distribution of the vectors and control sequences to the interfaces.

SCANFLEX is a modular JTAG/boundary scan controller. Based on state-of-the-art multi-core processors and FPGAs, it allows users to execute test and programming technologies from Embedded JTAG Solutions. Its multifunctional architecture enables these technologies to be combined flexibly and with high performance on a single platform. SCANFLEX II has eight independent, truly parallel test access ports (TAP) for up to 100MHz. This enables the synchronized execution of embedded test, debug, and programming operations via boundary scan (IEEE1149.x), processor emulation, chip integrated instruments, or the embedded diagnostics method.

About GÖPEL electronic
GÖPEL electronic develops and manufactures innovative electrical and optical test, measurement, and inspection equipment for electronic components and printed circuit board assemblies as well as industrial and automotive electronics systems. The company is active worldwide, with its own subsidiaries as well as through distributors, and generated sales of approximately 40 million euros in 2023 with 240 employees.

The post Boundary scan in combination with automotive applications for CAN-FD and LIN bus appeared first on ELE Times.

A convenient desktop-accessible calculator of E-series component values

EDN Network - Tue, 04/07/2026 - 15:00

As explained in the E series Wikipedia page: “The E series is a system of preferred numbers (also called preferred values) derived for use in electronic components. It consists of the E3, E6, E12, E24, E48, E96, and E192 series, where the number after the ‘E’ designates the quantity of logarithmic value ‘steps’ per decade. Although it is theoretically possible to produce components of any value, in practice, the need for inventory simplification has led the industry to settle on the E series for  resistors, capacitors, inductors, and zener diodes.”

Wow the engineering world with your unique design: Design Ideas Submission Guide

It’s convenient at times to have a desktop calculator that accepts a computed value x and returns the standard, commercially available value closest to it for a specified E series. Here, “closest” means that candidate value for which the absolute value of the computed error (candidate/x – 1) is the smallest.

The following GitHub link:

hosts the files needed to create the desktop icon, which calls the application, both of which are shown in Figure 1. It also contains a README file, which details how to install the files on a Windows PC, and a User Manual.

Figure 1 The desktop icon that calls the application, which is also shown. The E3 series has been selected, and a computed value of 56 has been entered. The closest E3 series value of 47 is apparent, along with the calculated error of the selected candidate.

Selecting a different series will automatically calculate and present the nearest value and its error for that series. Pressing the <Enter> key in the Enter Value box will clear the entry so that a new one can be checked. The Enter Value numeric sequence may be followed by an exponent (e6, E-2, etc.). A single alpha character (for instance, M, k, n, or others) also may be appended. Neither is necessary, but the format of the Nearest E value will always follow that of the Enter value.

Although not needed often, this is convenient to have around with the touch of a Desktop icon. Move it elsewhere if the Desktop is not your preferred location.

Christopher Paul has worked in various engineering positions in the communications industry for over 40 years.

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The post A convenient desktop-accessible calculator of E-series component values appeared first on EDN.

BluGlass signs AUS$1.3m agreement with global Fortune 500 data storage leader

Semiconductor today - Tue, 04/07/2026 - 13:27
BluGlass Ltd of Silverwater, Australia — which develops and manufactures gallium nitride (GaN) visible laser diodes based on its proprietary low-temperature, low-hydrogen remote-plasma chemical vapor deposition (RPCVD) technology for quantum, defence and biotech markets — has entered a AUS$1.3m strategic collaboration with a “Fortune 500 global mass-capacity data storage leader”...

Конференція Tech360: Policy Meets Technology

Новини - Tue, 04/07/2026 - 12:37
Конференція Tech360: Policy Meets Technology
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kpi вт, 04/07/2026 - 12:37
Текст

Нещодавно відбулася конференція Tech360: Policy Meets Technology — захід присвячений повному циклу розвитку ІТ-бізнесу в Україні, організований Асоціацією IT Ukraine. Подія зібрала понад 800 учасників: керівників технологічних компаній, представників держсектору та провідних університетів.

Почесною відзнакою Вченої ради університету нагороджено Олександра Мохунька

Новини - Tue, 04/07/2026 - 12:23
Почесною відзнакою Вченої ради університету нагороджено Олександра Мохунька
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kpi вт, 04/07/2026 - 12:23
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На засіданні Вченої ради КПІ ім. Ігоря Сікорського Почесною відзнакою Вченої ради університету нагороджено Олександра Дмитровича Мохунька — старшого викладача кафедри технологій оздоровлення та спорту (ФБМІ), ветерана російсько-української війни.

ACM Research unifies product portfolio as ACM Planetary Family

Semiconductor today - Tue, 04/07/2026 - 12:22
ACM Research Inc of Fremont, CA, USA — which develops and manufactures processing equipment for semiconductor device and wafer- and panel-level packaging (WLP) applications — has announced a new branding and organization of its product portfolio into a unified, process-based structure, referred to as the ACM Planetary Family...

IVWorks raises $4.5m to expand reGaN technology into RF and AI power semi markets

Semiconductor today - Tue, 04/07/2026 - 12:06
IVWorks Co Ltd of Daejeon, South Korea – which was founded in 2011 and manufactures 100–200mm gallium nitride (GaN) epitaxial wafers for RF & power electronics applications – is accelerating its expansion into the GaN semiconductor market through its proprietary reGaN technology while continuing to expand its core epiwafer business across multiple advanced device platforms. Leveraging its epitaxy expertise, the firm is positioning itself as a solution provider for next-generation RF and power semiconductor applications, including aluminium nitride (AlN) high-electron-mobility transistors (HEMTs) on silicon carbide (SiC), GaN HEMT on silicon, and vertical GaN epiwafers...

🏓 Спортивні секції для студентів

Новини - Mon, 04/06/2026 - 21:51
🏓 Спортивні секції для студентів
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kpi пн, 04/06/2026 - 21:51
Текст

Всі студенти КПІ ім. Ігоря Сікорського мають можливість відвідувати спортивні секції за власним бажанням як факультатив, у вільний від пар час. За ці заняття не буде ні балів, ні рейтингів, ні заліку – ви займаєтесь виключно для себе, свого здоров'я та задоволення.

My first ever soldered circuit

Reddit:Electronics - Mon, 04/06/2026 - 18:41
My first ever soldered circuit

it will be used to control 5 motors from a raspberry pi as well as sense a voltage drop across the resistor for current sensing and motor stall detection using an arduino nano as an ADC. It will be used to actuate fingers in a prosthetic hand for a uni project! less

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Netgear’s LM1200: A 4G LTE modem, modestly funded

EDN Network - Mon, 04/06/2026 - 15:00

It may not support the latest-and-greatest cellular data tech. But in a pinch, it’ll cost-effectively still do the Internet-access trick.

In one of last month’s posts, covering cellular hotspots for maintaining broadband connectivity when premises power goes down, as well as when you’re on the road, I wrote:

Last January I’d purchased on sale from Amazon two NETGEAR LM1200 cellular broadband modems, one for teardown-to-come and the other for precisely the scenario—premises power-loss connectivity backup—that I experienced in mid-December. They aren’t as-is usable [unless you only need to have one wired-connected device online, that is], requiring tether to a router. But I have plenty of those in inventory. And had we stuck around the home more than one night I probably would have pressed the modem-plus-router combo into service, fueled by a portable power unit. But another limitation, bandwidth, was the same one that already soured me on the Surface Pro X’s integrated modem (along in the ones in my Intel-based Surface Pros, for that matter). The LM1200 “only” supports 4G LTE, which is likely why I bought them (on closeout, I suspect) for only $19.99 each a year-plus back, versus the original $49.99 MSRP.

Today, I’ll be actualizing my year-plus back teardown aspiration, as usual beginning with some outer box shots…as usual accompanied by a 0.75″ (19.1 mm) diameter U.S. penny for size comparison purposes:

Flip up the top flap:

and the first things you’ll see are our patient, underneath two slips of paper (also found here in PDF form, along with a fuller user manual). Below them:

are two cables, one for power and the other for data connectivity, along with a power adapter:

Last things first; the AC-to-DC adapter, with a USB-A output (with only notable sides shown):

and the two cables:

Now for our patient:

TS-9 connectors (plus other interesting things, such as the nano SIM slot) ‘round back, the same as with the high-end NETGEAR MR6110 cellular hotspot I showcased a month back:

and as before intended for tethering the cellular modem to an optional external antenna:

Onward:

Note the passive ventilation abundance underneath; a curious choice, given that heat rises, not sinks (and don’t get me started on the confusion inherent to the term “heatsink”), but better than nothing, I guess:

A closeup of the label reveals, among other things, the all-important FCC ID (PY320300503):

60 FCC certification record entry results. That’s a new record, at least for me!

Rubberized feet tend to hide (albeit not always, mind you) screw heads, providing pathways inside:

The typical presence pans out once again in this instance:

And we’re in. The top and bottom chassis pieces both detach:

leaving behind the PCB, along with chassis remnants around the periphery:

which also separate straightaway, this time with no additional screws to mess with:

Let’s start with the top of the PCB:

Dominating the landscape is a Quectel EC25-AF PCIe LTE Cat 4 module, rotated 180° in this photo so you can discern the topside printing right-side-up:

Below it are the four status LEDs whose illumination ends up shining out the holes at the top of the device. And above it are two Youth Electronics GS12401C LAN transformers, one each for the cellular modem’s LAN and WAN ports.

Next, those two long-and-skinny shiny metal pieces, one on each side of the PCB:

They’re, you’ve probably already guessed, the 4G cellular antennae.

Now for the other (bottom) side of the PCB:

Faraday Cages. Regular readers already know what comes next:

Nothing terribly exciting here, that is unless you’re an RF engineer:

How about the larger one?

Another 4R7 (4.7 microhenry) inductor. Plus, a Qualcomm Atheros QCA8334 four-port Gbit Ethernet switch IC, only two ports’ worth of resources which are presumably in use (for the aforementioned LAN and WAN backside ports). And scattered about the remainder of this PCB side’s real estate are clusters of test points, passives, discretes and other diminutive doodads.

And there we are! After this writeup is published and I answer any lingering reader questions, I’ll pop the Faraday Cage tops back on, reassemble the surrounding chassis and see if it still works. And speaking of questions, please do sound off with your thoughts in the comments!

Brian Dipert is the associate editor, as well as a contributing editor, at EDN Magazine.

Related Content

The post Netgear’s LM1200: A 4G LTE modem, modestly funded appeared first on EDN.

🎉 День відкритих дверей КПІ Open Day

Новини - Mon, 04/06/2026 - 10:22
🎉 День відкритих дверей КПІ Open Day
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kpi пн, 04/06/2026 - 10:22
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Національний технічний університет України «Київський політехнічний інститут імені Ігоря Сікорського» запрошує учнів старших класів, студентів закладів фахової передвищої освіти та їхніх батьків відвідати День відкритих дверей — КПІ Open Day.

КПІ поглиблює співпрацю з ENSTA

Новини - Mon, 04/06/2026 - 10:00
КПІ поглиблює співпрацю з ENSTA
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KPI4U-2 пн, 04/06/2026 - 10:00
Текст

☑️ Троє викладачів і четверо студентів КПІ ім. Ігоря Сікорського у межах проєкту Erasmus+ KA171 відвідали ENSTA (École Nationale Supérieure de Techniques Avancées) — провідний заклад французької інженерної освіти, де готують фахівців для високотехнологічних секторів: від транспорту, морської інженерії та оборони до прикладної математики й комп’ютерних наук.

Mastering differential probes: Fundamentals and advanced insights

EDN Network - Mon, 04/06/2026 - 04:29

Differential oscilloscope probes are indispensable tools for engineers who need to measure signals accurately in complex environments. Whether you are troubleshooting everyday low-voltage circuits or tackling the challenges of high-voltage power electronics, the right probe ensures safety, precision, and reliable data capture. Yet, with so many options available—each designed for specific ranges and applications—understanding how to select and use differential probes effectively can make the difference between clear insights and misleading results.

This article explores the essentials of differential probes, highlighting their role in both common and high-voltage measurements, and offering practical guidance for engineers who want to master their use.

Understanding differential probes

At their core, differential probes are designed to measure the voltage difference between two points that are not referenced to ground. Unlike single-ended probes, which assume one side of the signal is tied to earth ground, differential probes float with the circuit under test, making them ideal for analyzing signals in isolated systems, switching power supplies, motor drives, and other environments where ground-referenced measurements can be misleading—or even unsafe.

By rejecting common-mode noise and providing accurate readings across a wide voltage range, differential probes give engineers the confidence to capture clean waveforms in both everyday low-voltage circuits and demanding high-voltage applications.

The poor man’s alternative: A-B math mode

Some engineers turn to the oscilloscope’s A–B math mode as a low-cost substitute for a true differential probe. By connecting two standard single-ended probes to separate channels and subtracting one from the other, the scope can display the voltage difference between two points. While this trick works for basic low-voltage measurements, it suffers from a critical drawback: poor common-mode rejection ratio (CMRR).

Furthermore, this method creates a dangerous grounding hazard; because standard probes remain tied to the scope’s Earth-grounded chassis, attempting this on floating high-voltage circuits can cause a catastrophic short circuit that a true, isolated differential probe would easily prevent.

Dedicated differential probes are carefully designed with matched inputs, shielding, and circuitry that reject common-mode noise and interference. In contrast, the A–B math method relies on two independent channels that rarely match perfectly in gain, phase, or frequency response.

As a result, common-mode signals leak into the measurement, producing distorted or noisy waveforms. This makes A–B math unsuitable for precision work and unsafe for high-voltage applications, where accurate rejection of common-mode voltage is essential (while floating-input oscilloscopes are an effective alternative, we will not be covering them in this post).

Figure 1 The A–B math mode on an oscilloscope uses two channels to approximate a differential measurement. Source: Author

Isolation transformers: A stopgap, not a solution

One of the most dangerous pitfalls in high-voltage oscilloscope measurements is the ground clip trap. Even if the circuit is floated, the probe’s ground clip remains internally tied to earth ground. Accidentally clipping to a high-voltage node can instantly short the circuit, destroy equipment, and pose a severe shock hazard.

A common workaround is to power the device under test (DUT) through an isolation transformer, breaking the direct connection to earth ground. This allows probes to be connected more flexibly and can make certain measurements possible when a proper probe is unavailable.

Floating a circuit also introduces new risks: exposed nodes may sit at dangerous potentials relative to ground, and the oscilloscope itself can be compromised if isolation fails. For these reasons, the 1:1 isolation transformer approach should be regarded only as a stopgap “poor man’s” option. When working with high-voltage systems, the safe and reliable solution is always a properly rated probe designed for the task.

Figure 2 A 1:1 isolation transformer lets probes connect without a ground reference, but the ground clip stays internally tied to earth and poses risk. Source: Author

It’s worth noting is that isolating the DUT—rather than the oscilloscope—is a standard power electronics practice that significantly assists a differential probe by floating the entire circuit’s reference. This setup effectively eliminates ground loops that otherwise inject EMI into your measurements via the probe’s cable shielding.

More importantly, it reduces common-mode stress on the probe’s internal amplifiers; since the DUT is no longer hard-tied to Earth ground, the probe does not have to fight a massive voltage potential relative to the scope’s chassis. This results in a much cleaner signal with higher fidelity, particularly when probing high-side MOSFETs or bridge rectifiers where the reference point is constantly swinging.

The right take: Differential scope probes

So, differential probes are specialized tools for measuring the voltage difference between two points in a circuit. They feature two inputs that can be connected anywhere without requiring a ground reference. An internal differential amplifier produces an output voltage proportional to the difference between the chosen points, typically scaled by a user-defined attenuation factor.

Figure 3 An active differential probe extends the measurement capabilities of a standard oscilloscope. Source: Pico Technology

Recall that a major advantage of differential probes is their ability to reject common-mode signals—voltages present simultaneously at both inputs. This makes them highly effective for capturing low-level signals in noisy environments. They can also be used for single-ended measurements by grounding one of the leads.

As an aside, it’s worth mentioning that a differential probe is not the same as a differential preamplifier like the Tektronix ADA400A. Probes are designed for general oscilloscope measurements across a wide bandwidth, while preamplifiers are specialized for ultra-low-level, low-frequency signals. ADA400A, for example, offers selectable gain and filtering, making it ideal for micro-volt level work in noisy environments.

Although ADA400A is still supported and available through some distributors, it’s considered more of a legacy accessory than a mainstream option. In practice, that means it remains useful for precision applications but is not promoted for new designs the way modern differential probes are. In short, use a probe for broad, everyday measurements, and reach for a preamp when chasing precision at the very bottom of the signal scale.

Getting back on track, high-voltage differential probes are among the most widely used types in modern test and measurement setups. And, galvanically isolated HV differential probes go further by providing complete electrical separation between the high-voltage circuit under test and the oscilloscope, protecting both the operator and sensitive equipment.

This isolation—often implemented through optical coupling techniques—prevents ground loops, reduces noise interference, and ensures accurate measurements even in environments with large voltage swings. Their combination of safety, fidelity, and versatility makes them indispensable tools in high-voltage and high-power applications.

As a summary (kept simple for clarity), all differential probes rely on active circuitry, since measuring the voltage difference between two points requires rejecting common-mode signals. Everyday differential active probes are used for precision work in high-speed digital and low-level analog circuits.

For power electronics, high-voltage differential active probes are the standard, enabling safe measurement of floating signals and large common-mode voltages. And when maximum safety and fidelity are needed, galvanically isolated differential probes—often using optical isolation—provide complete separation between the circuit under test and the oscilloscope, preventing ground loops and protecting both operator and equipment.

Practical session: Use cases and key specifications

This session is on the practical side, focusing on when differential probes are actually needed and the key specifications that matter most when choosing one.

Needless to say, differential probes are required whenever signals are not referenced to ground or involve large common-mode voltages. A classic case is measuring the gate-to-source voltage on a high-side MOSFET in a switching converter. Because the source terminal is floating and rides on the switching node, a standard single-ended probe tied to ground would be unsafe and misleading.

In this situation, a high-voltage differential active probe captures the true waveform safely, and if voltages or noise are extreme, an optically isolated probe adds full separation between circuit and oscilloscope for maximum protection and accuracy.

Figure 4 A practical application example using a differential probe to capture floating gate-to-source voltage signals in a power electronics circuit. Source: Author

Below are the key specifications engineers should keep in mind:

  • Common mode rejection ratio (CMRR): Measures how well the probe ignores “noise” or voltages that appear equally on both leads. Note that CMRR is frequency-dependent and typically drops as the signal frequency increases. A higher CMRR ensures cleaner measurements in high-interference environments.
  • Voltage rating: Defined by both differential voltage (between leads) and common-mode voltage (leads to ground), often categorized by CAT safety ratings such as CAT II and CAT III). These ratings ensure the probe can safely handle both the signal’s magnitude and any potential transients in your application.
  • Attenuation ratio: Most differential probes provide fixed or switchable ratios. This setting defines how much the input signal is scaled down before reaching the oscilloscope, balancing high-voltage safety with signal fidelity.
  • Bandwidth: Determines how faithfully fast signals are captured. Because square waves are composed of high-frequency harmonics, a probe’s bandwidth should ideally be 3 to 5 times higher than the signal’s fundamental frequency to avoid “rounding off” sharp transitions.
  • Input Impedance: High resistance minimizes DC loading on the circuit. However, be aware that effective impedance drops significantly at high frequencies due to the effects of internal capacitance.
  • Input capacitance: This is the primary factor that “slows down” fast transitions or causes circuit loading at high speeds. Lower capacitance is essential for maintaining signal integrity and preventing the probe from changing the behavior of the circuit under test.

Clearing the mist on differential probes

As often, this post also leaves some mist but hopefully clears enough to reveal the essentials. Differential probes are not exotic extras—they are the right tool whenever signals float, swing at high voltages, or demand precision beyond what a single-ended probe can safely deliver.

From active types for clean digital and analog work, to high-voltage versions for power electronics, and galvanically isolated probes for maximum safety, the choice comes down to matching probe and specs to the measurement challenge. And those specs—CMRR, bandwidth, risetime, voltage rating, attenuation ratio, input impedance, capacitance—are not just numbers; they decide whether your waveform is faithfully captured or dangerously distorted.

So next time you reach for a probe, pause to check your choice and its specs—the right differential probe is not optional, it’s essential for accuracy, safety, and confidence in your measurements.

T. K. Hareendran is a self-taught electronics enthusiast with a strong passion for innovative circuit design and hands-on technology. He develops both experimental and practical electronic projects, documenting and sharing his work to support fellow tinkerers and learners. Beyond the workbench, he dedicates time to technical writing and hardware evaluations to contribute meaningfully to the maker community.

Related Content

The post Mastering differential probes: Fundamentals and advanced insights appeared first on EDN.

Years ago i tried to recover data from nand flash chips after my disk controller burned

Reddit:Electronics - Mon, 04/06/2026 - 01:30
Years ago i tried to recover data from nand flash chips after my disk controller burned

I dont have more images., I used a raspberry pi pico with a voltage conversion board. the chips were taken from the disk not in a beautifull condition so I need to make these copper boards.. (actually if the chips are taken correctly there are special sockets for them). After the software was done I discovered these chips also were failing ran very hot. So it wasn't a success...

submitted by /u/Distinct-Question-16
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Made this atrocity and just thinking of the possibilities

Reddit:Electronics - Sun, 04/05/2026 - 22:05
Made this atrocity and just thinking of the possibilities

I made this atrocity with a CAN bus module, SD card module, humidity, temp, pressure, acceleration and gyro sensors. The use-case here really to extract and log everything from a CAN bus, dump it to SD and then download the data with bluetooth to an android device and push to a hosted API for analysis. Then optimize how to run an outboard engine (rpm, energy/distance, trim etc).

But my point is, why didn't I do this shit 10 years ago? Or is it just that this has never been this easy before? It's just so much fun. Ignore the arduino in the background, it was my only available breadboard at the time.

I'm a CS major, never really done any electronics but tons of programming on all levels. I can't understand why I have never even tried this before. The possibilities are endless!

Using an ESP32-S3 Devkit for this project, which seems very capable and speaks CAN natively. Feel free to citique the soldering, it's my first time soldering small things.

submitted by /u/wenoc
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