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Київський політехнічний інститут поділився експертними висновками у глобальному дослідженні щодо конкурентоспроможності 6G kpi чт, 06/25/2026 - 12:42

Як гостьові лекції розширюють освітні горизонти факультету лінгвістики Інформація КП чт, 06/25/2026 - 12:00

Eggtronic of Modena, Italy (which provides mixed-signal IC controllers for power electronics) has released a jointly developed 500W solar microinverter reference platform with Renesas Electronics Corp of Tokyo, Japan...

I'm designing a DIY remote intended as a soldering kit. My design requirements were: Use a few parts as possible Make easy to assemble (so THT parts only) Make it modular so that main parts can be taken out and used in other projects. First I had to think about power management, microcontroller and RF module. I'll start with the RF module first... I chose the popular nRF24L01, although the version I am using has a can on it and has FCC/IC. I prefer this version over the generic one that is everywhere. Works well and has a ton of support! The range it can achieve is also more than sufficient for the intended applications. Since this RF module does not officially support 5V (Yes, I contacted the manufacturer .. there are some versions of the nRF24L01 that *do* support 5V, but this module does not), I had to stick with 3.3V. As my first design goal was to use as few parts as possible, I did not want to use a logic level shifter (LLS). So I needed a microcontroller that operates on 3.3V. Like the Pro Mini, but in my case a Nano form factor running on 3.3V (I had to drop the clock frequency a bit to remain within manufacturer suggested conditions). Even at reduced clock speed, the ATmega328 running at 8MHz and the nRF2401 module combined are still quite fast... at least for the human mind. (more on that below) Both the RF module and the microcontroller can operate well at 3V, so I figured I just use two AA batteries. Then I only need some filters but no other real power management components like a linear regulator. Perfect for what I was trying to design. Also, I wanted to pick batteries that are super common, cheap enough and can be recharged. I made a 3D printed base for this remote as well and it now hold very well. I used the remote as a general HID controller for a couple custom games I made and it works great. Response time is super (no lag or delay that is noticeable) and the battery lasts more than a day. All the parts are THT (through-hole) and therefore easy to solder together (second design goal). I mounted the RF module and the microcontroller using female headers. They are secure enough but this allows them to be removed easily and used in other projects. This was my third design goal. I am working on a remote car and drone (under 250g), both of which can also be controlled with this remote. So there are quite some applications. submitted by /u/PTSolns [link] [comments]

Artificial intelligence (AI) is accelerating semiconductor innovation at a pace that is forcing a rethinking of conventional production test strategies. The rapid scaling of graphics processing units (GPUs), AI accelerators, and heterogeneous compute architectures is increasing not only device complexity, but also the amount of test content required to validate performance, reliability, and quality across the manufacturing flow.

As AI infrastructure investments continue to expand, semiconductor manufacturers are building increasingly sophisticated devices that combine massive transistor counts, advanced packaging, high-bandwidth memory (HBM), chiplet architectures, and emerging co-packaged optical (CPO) interfaces. These devices are redefining the relationship between design, validation, and production test.

The result is a new test paradigm in which test content, infrastructure, and analytics are distributed dynamically across multiple insertions—from wafer sort through system-level test (SLT)—to balance cost-of-test, defective-parts-per-million (DPPM), and time-to-market objectives.

 

AI devices driving a step change in test requirements

The transition from monolithic devices to heterogeneous multi-die systems has substantially increased the burden on automated test equipment (ATE). AI processors now incorporate far more compute engines, memory bandwidth, and power-delivery complexity than previous generations of high-performance devices.

At the same time, traditional transistor scaling no longer delivers the same gains once associated with Moore’s Law. To continue improving system performance, designers are adopting More-than-Moore integration strategies that combine chiplets, 3D packaging, integrated voltage regulation, and advanced interconnect technologies within increasingly dense package architectures. These changes are producing several cascading effects on tests.

First, scan and functional test workloads are growing dramatically as transistor counts increase. Modern AI devices require extremely large volumes of scan vectors that must be delivered at gigabit-per-second speeds through either massively parallel digital channels or high-speed serial interfaces such as PCIe and USB.

Second, power requirements are rising rapidly. Device power supplies must now support kiloamp-class current delivery while maintaining tight regulation and accuracy under highly dynamic loading conditions. Flexible power architectures capable of extensive channel ganging are becoming increasingly important as final-test power envelopes continue to climb.

Thermal management is becoming equally critical. AI devices entering production are expected to push package-level power dissipation into multi-kilowatt ranges, making active thermal control essential throughout the test flow. In advanced environments, thermal systems are increasingly paired with predictive analytics capable of anticipating thermal excursions before they occur, enabling proactive cooling and tighter junction-temperature management.

Advanced packaging complicates multisite test

Migration toward larger 2.5D and 3D packages is also changing the physical realities of production test. As package sizes expand to accommodate more chiplets, HBM stacks and photonic components, device handling and multisite efficiency become more difficult to optimize. Larger sockets consume increasing amounts of device-under-test (DUT) board real estate, constraining routing resources and limiting tester scalability.

In parallel, manufacturers are moving toward larger tray formats carrying fewer devices per tray because of package dimensions and handling constraints. These shifts reduce some of the traditional efficiencies associated with high-parallelism production environments.

The addition of photonic and CPO technologies introduces another layer of complexity. Optical interfaces require integrated electro-optical validation across multiple stages of manufacturing, extending test coverage well beyond conventional electrical characterization. As a result, optical instrumentation is increasingly being introduced at wafer probe, optical-engine test, final package test, and SLT insertions.

Test engineering becoming more software- and data-centric

The growing complexity of AI devices is changing not only hardware requirements, but also the nature of test engineering itself. In other words, engineering organizations are under pressure to accelerate bring-up, reduce debug cycles, and maintain quality targets despite rapidly increasing test content volumes. This is driving tighter integration between design, silicon validation, and manufacturing teams.

As a result, AI-assisted software tools are beginning to play a larger role in test-program generation, debug optimization, and adaptive workflow management. Real-time analytics platforms can now aggregate data across multiple insertions, enabling faster correlation of failures and more intelligent allocation of test coverage throughout the production flow.

In these environments, test content is no longer statically assigned to a single insertion. Instead, coverage increasingly shifts throughout the flow depending on where defects can be detected most efficiently and economically. This distributed approach to test is becoming essential as AI devices scale toward trillion-transistor complexity.

Shifting test left reduces packaging risk

One major trend is the movement of more test content earlier in the manufacturing flow. For advanced AI devices, packaging costs now represent a substantial portion of total product cost because of technologies such as HBM and chip-on-wafer-on-substrate (CoWoS) integration. Packaging defective die into expensive multi-die assemblies can significantly increase material waste and reduce yield.

To mitigate this risk, manufacturers are pushing more coverage to wafer-level and die-level test insertions to improve known-good-die confidence before assembly. Figure 1 illustrates how test distribution increasingly spans the entire workflow, with tighter interaction between design, validation, and production environments.

Figure 1 Test distribution has expanded to accommodate growing need for test across the manufacturing ecosystem—beginning with silicon validation and extending through system-level test. Source: Advantest

This shift-left strategy (Figure 2) includes broader scan coverage and expanded fault modeling at speed testing, and increasingly system-aware functional validation at the die level. Some workflows also incorporate calibration, trimming, and memory repair operations prior to package assembly.

Figure 2 Shifting test content left enables more coverage at wafer and die test stages to improve known-good-die screening before package assembly. Source: Advantest

In more advanced implementations, active thermal control capabilities are also migrating closer to singulated-die test stages. The objective is straightforward: identify marginal or defective components before they enter expensive advanced-packaging flows.

System-level test expanding

At the same time, other forms of coverage are shifting later in the process. As devices become more heterogeneous and application-specific, certain failure mechanisms emerge only under realistic operating conditions involving software execution, thermal loading, timing interactions, or high-bandwidth traffic patterns.

These conditions are often difficult—or impossible—to replicate during traditional structural or functional test insertions. Consequently, SLT is becoming increasingly important for AI and HPC devices. System-level environments can expose defects associated with workload execution, protocol interactions, and real-world operating states that are not observable during earlier production stages.

New approaches, including scan-over-PCIe methodologies and highly parallel SLT architectures, are helping manufacturers improve coverage while attempting to control the significant test times associated with these environments. Figure 3 illustrates the corresponding shift-right strategy.

Figure 3 Shifting test content right enables additional test coverage to be executed after packaging to further reduce DPPM before shipment. Source: Advantest

Real-time analytics enabling adaptive test distribution

The increasing fragmentation of test insertions is creating demand for tighter orchestration across the production floor. Modern test infrastructures are evolving toward highly connected environments in which data streams continuously between validation, wafer sort, final test, and SLT operations. Real-time analytics platforms can then use this data to optimize insertion decisions, adapt test limits, and improve yield-learning cycles.

GPU-accelerated edge inferencing and AI-based decision engines are also enabling faster adaptive responses during production. In some cases, computation can be offloaded from the tester itself to remote compute infrastructure, allowing more sophisticated analytics without compromising throughput.

This level of coordination requires consistent software frameworks and portable test content capable of moving seamlessly between insertions and platforms. So, shared execution environments and unified debug tools are becoming increasingly important as manufacturers attempt to reduce engineering overhead while accelerating deployment.

Optical test adds new workflow stages

CPO and photonic integration introduce additional challenges because optical functionality must be validated alongside traditional electronic behavior. Unlike conventional semiconductor devices, photonic systems often require multiple dedicated insertion points throughout manufacturing. These may include photonic wafer test, dual-sided probing of electronic and photonic die, optical-engine characterization, and additional packaged-module validation after integration with ASICs.

As with electrical tests, much of this optical validation is shifting earlier in the flow to ensure known-good optical engines prior to final assembly. However, full electro-optical verification often still requires additional socketed final-test and SLT insertions after system integration.

Figure 4 highlights how optical test introduces additional insertion points spanning photonic wafer test, optical-engine validation, final package test, and SLT.

Figure 4 For testing CPO devices, test content shifts left for three insertions and right for final socketed device test. Source: Advantest

Test distribution is becoming a strategic optimization problem

AI is transforming semiconductor tests from a relatively linear production step into a highly distributed optimization challenge involving power, thermal management, data analytics, packaging economics, and workflow orchestration. Meeting future quality and throughput requirements will require closer collaboration across the semiconductor ecosystem, including design teams, ATE suppliers, packaging providers, and system integrators.

As AI devices continue scaling in complexity, test infrastructure must evolve from traditional defect screening toward intelligent, adaptive validation environments capable of making real-time decisions across the manufacturing flow. In that sense, the future of semiconductor test may depend as much on data movement and workflow intelligence as on the tester hardware itself.

Fabio Pizza is business segment manager at Advantest Europe.

Related Content

• Will AI come to the test industry?
• Optimizing Automated Test Equipment for Quality and Complexity
• Advanced verification: unlocking the door to a new era of AI chips
• AI test chip offers proof of concept for digital in-memory compute design
• From Defect Images to Die Prediction: How Intel Is Scaling AI in Advanced Manufacturing

The post How AI is driving a new paradigm in test distribution appeared first on EDN.

У КПІ відкрили оновлену навчально-наукову лабораторію технології та модифікування біополімерів kpi ср, 06/24/2026 - 16:58

Hey guys I just made my first ever PCB at college. I designed it online and then cut it out with a PCB-CNC machine. We didn’t have time for the teachers to show me the masking process so we just did it without. \\ The red wire is because I made a mistake with the design but it worked out in the end. \\ It’s a traffic light if you couldn’t tell with an AtMega submitted by /u/EDC_powerlifter [link] [comments]

An only slightly less simple followup circuit also ratios sensor capacitance to a reference capacitor to measure micrometers…this time linearly.

A few weeks ago, Design Ideas published a simple circuit of mine that provides an analog interface to capacitive position sensors. Figure 1 shows that basic design with its separate complementary outputs: Out and –Out.

Wow the engineering world with your unique design: Design Ideas Submission Guide

Figure 1 The U1a and U1b cross-coupled Schmidt trigger timers form a ~1MHz RC multivibrator. The Tsense pulse width is inversely proportional to sensor displacement (Tref/Tsen= Cref/Csen = d).

Figure 2 shows the “Simple Simon” method it offered for acquisition of the sensor position signal: passive RC averaging of the Tsense pulse train.

Figure 2 Passive RC averaging of the Tsense output yields the analog position output.

The resulting analog output, as shown in figure 3, provides good range and resolution but is nonlinear.

Figure 3 This graph shows the sensor performance when Out is connected to a 12bit ADC using +5V for its reference. The black curve (left axis) equals the plate separation (d) in millimeters. The red curve (right axis) equals the ADC lsb resolution in micrometers.

So, I got to thinking about linearization and the advantages it would provide, and wondering how tough it would be.  It turned out to be not that difficult. 

Figure 4 shows the resulting interface with added linearization circuitry.  Just an added opamp, three resistors, and two non-critical caps did the trick.  Here’s how it works.

Figure 4 Averaging integrator A1 linearizes the displacement sensing response.  R5 is shown as a precision type, albeit just out of force of habit.  It, like the ON resistances of U2’s switches, actually cancels out.

Each capacitance measurement cycle, the 500ns Tref pulse causes 4066 switch U2d to deposit a quantum of charge on integrator A1’s summing node of Qref = Tref/R5.  Meanwhile the sensor-capacitance proportional Tsen pulse subtracts Qsen = Tsen(Vout – 1)/R5.  The charge balance is forced by A1 to maintain Qsen = Qref, therefore Tsen(Vout – 1)/R5 = Tref/R5, and Vout – 1 = Tref/Tsen = Cref/Csen = d. Note that R5 magically (?) disappears from the math.

Figure 5 shows the straight-as-an-arrow-in-zero-gravity result.

Figure 5 In this graph of the enhanced circuit results, the black curve equates to the sensor readout d in mm, with red at a constant 1 mV per micron resolution.

Stephen Woodward‘s relationship with EDN’s DI column goes back quite a long way. Over 200 submissions have been accepted since his first contribution back in 1974.  They have included best Design Idea of the year in 1974 and 2001.

Related Content

• ~0.1% resolution capacitive position sensor
• Capacitor matchmaker
• CMOS flip-flop used “off label” implements precision capacitance sensor
• From gap to signal: Non-contact capacitive displacement sensors
• Simple circuit interfaces differential capacitance sensor

The post Capacitive position sensor with linearized output appeared first on EDN.

The research institute TNO (the Netherlands Organization for Applied Scientific Research in Delft) and equipment provider Advanced Semiconductor Materials Lithography (ASML) of Veldhoven, The Netherlands have announced a new partnership that aims to strengthen the European semiconductor ecosystem through the development and industrialization of photonic chips. The collaboration focuses on the utilization of TNO’s new Photonic Chip Pilot Line currently under construction at the High Tech Campus in Eindhoven...

This is my version of qron0b. Meet takku:b, a BCD wristwatch which uses CR2032. It uses 0.6uA during sleep and when awake uses around 4mA - 4.5mA depending on the amount of LED is turned on. It is made using STM32L010C6 It currently displays following info on each cyclic display: Time in Hours and Minutes Weekday and Date Month and Year Will be adding alarm soon. submitted by /u/Independent_Limit_44 [link] [comments]

Infineon Technologies AG of Munich, Germany says that its CoolGaN Transistor 100V devices have been selected by BRC Solar GmbH of Ettlingen, Germany (which provides module-level power electronics for photovoltaic systems) as the core switching technology for its Power Optimizer...

Міжнародна конференція "Прикладна геометрія, інженерна графіка та об'єкти інтелектуальної власності" 2026 Інформація КП ср, 06/24/2026 - 12:00

ClassOne Technology of Kalispell, MT, USA (which manufactures electroplating and wet-chemical process systems for ≤200mm wafers) has announced record follow-on orders from Applied Optoelectronics Inc (AOI) of Sugar Land, TX, USA (a designer and manufacturer of optical and hybrid fibre-coaxial networking products for AI data centers, cable TV and broadband fiber access networks) for multiple Solstice S8 single-wafer wet processing systems to support AOI’s expanding production of optical devices in Houston...

SmartController from GÖPEL electronic offers a framework and versatile interfaces for controlling demanding tests, demonstrations, and laboratory applications

In the automotive sector, individual components such as vehicle seats often need to be tested or demonstrated independently of the overall configuration to ensure functions such as adjustment ranges, massage, heating, and ventilation. However, the control elements and power supply configured for the final vehicle are not available for this purpose. GÖPEL electronic has developed the SmartController for this application. This universal control solution is designed for demanding individual or endurance tests, presentations, and functional demonstrations, as well as laboratory applications. The powerful platform combines modern hardware, flexible software architecture, and intuitive operating concepts in a compact system.

The SmartController is based on the proven Serie62 G CAR 6281 hardware platform and offers a modular architecture with versatile interfaces. With this, GÖPEL electronic has created a universal hardware foundation that can be used across projects and customized as needs a clear advantage for test environments with changing requirements. Thanks to its high scalability, the SmartController supports up to eight bus interfaces, providing comprehensive support for automotive communication standards such as CAN, CAN-FD, LIN, and Automotive Ethernet, including residual bus simulation, diagnostics, and monitoring. The integrated Ethernet and Wi-Fi connectivity enables seamless networking and easy integration. This makes the SmartController suitable for both long-term endurance tests and dynamic development and presentation environments.

A key feature is the tablet control framework, which enables modern and convenient operation. Its uniform structure allows for use in various projects while maintaining a consistent user experience. Features such as the “Sticky Keys” input assistance (“Touch ’n’ Click / Make ’n’ Break”) support ergonomic and safe operation regardless of the hardware used. With the SmartController, GOEPEL electronic underscores its commitment to providing future-proof, modular, and practical solutions for vehicle development and industrial test applications.

The post Universal Control Solution for Endurance Tests of Vehicle Components appeared first on ELE Times.

AEC-Q102 Qualifies Devices Feature Spectral Sensitivity Matches to Human Eye and Improves Spectral Angular Performance in Compact 0805 and Top-View QFN Packages

Vishay Intertechnology, Inc. expands its optoelectronics portfolio with the introduction of two Automotive Grade PIN photodiode ambient light sensors that deliver enhanced optical accuracy and long-term reliability in harsh environments. AEC-Q102 qualifies; the Vishay Semiconductors VEMD4210FX02 and VEMD5525FX02 feature spectral sensitivity closely matched to the human eye response with a peak wavelength of 530 nm and no infrared (IR) bump.

The devices are designed for automotive applications, including automatic light control in Center Information Displays (CID), Head-Up Displays (HUD), and Rain Light Tunnel (RLT) systems, as well as backlight dimming in industrial equipment. By eliminating the IR bump in the spectral sensitivity curve, the devices ensure precise visible light measurement without unwanted IR influence in these applications. In addition, the devices’ superior angular characteristics ensure stable spectral accuracy regardless of the angle of incoming lighting for consistent and reliable light measurement performance.

For space-constrained applications, the VEMD4210FX02 offers a typical reverse-light current of 0.014 μA and a sensitivity range from 470 nm to 610 nm in a compact 0805 package with a radiant-sensitive area of just 0.42 mm². For applications requiring enhanced sensitivity, particularly in low-light conditions, the VEMD5525FX02 offers a reverse-light current of 0.11 μA and a sensitivity range from 480 nm to 590 nm in a top-view QFN package with a large 7.5 mm² radiant-sensitive area. Both parts also feature wettable flanks for optical solder joint inspection.

RoHS-compliant, halogen-free, and Vishay Green, the sensors feature a moisture sensitivity level (MSL) of 4 in accordance with J-STD-020 for a floor life of 72 hours. The devices support lead (Pb)-free reflow soldering and operate over an ambient temperature range of -40 °C to +110 °C.

 

Device Specification Table:

Part number	VEMD4210FX02	VEMD5525FX02
Typical reverse light current at EV = 100 lx (µA)	0.014	0.11
Angle of half sensitivity (°)	± 52	± 58
Range of spectral bandwidth (nm)	470 to 610	480 to 590
Wavelength of peak sensitivity (nm)	530	530
Package	0805	Top-view QFN
Dimensions (mm)	2.0 x 1.25 x 0.7	5.0 x 4.0 x 0.9
Radiant sensitive area (mm²)	0.42	7.5

 

The post Vishay Launches High-Accuracy Automotive Light Sensors appeared first on ELE Times.

submitted by /u/KrisMakesRandomStuff [link] [comments]

submitted by /u/Linker3000 [link] [comments]

Deposition equipment maker Aixtron SE of Herzogenrath, near Aachen, Germany says that the Massachusetts Institute of Technology (MIT) Lincoln Laboratory has purchased two Hyperion 300mm metal-organic chemical vapor deposition (MOCVD) systems as part of a partnership made possible by the Massachusetts Governor’s Office and the Northeast Microelectronics Coalition (NEMC). The systems will support research on gallium nitride (GaN) power electronics, radio-frequency applications, and next-generation two-dimensional materials, and will be available to users across the NEMC ecosystem and beyond...