Збирач потоків

NPL leading Government-backed metrology project to accelerate UK’s role in compound semiconductor innovation

Semiconductor today - 2 години 10 хв тому
The National Physical Laboratory (NPL) in Teddington, UK has been appointed by the Department for Science, Innovation and Technology (DSIT) to lead a £1.2m Government-funded project to establish new metrology capabilities that will strengthen the UK’s semiconductor innovation infrastructure. The strategic investment aims to accelerate the UK’s role in developing next-generation semiconductor materials and processes, helping to attract private investment and boost economic growth in the sector...

Keysight Hosts AI Thought Leadership Conclave in Bengaluru

ELE Times - 3 години 47 хв тому

 Keysight Technologies, Inc. announced the AI Thought Leadership Conclave, a premier forum bringing together technology leaders, researchers, and industry experts to discuss the transformative role of artificial intelligence (AI) is shaping digital infrastructure, wireless technologies, and connectivity.

Taking place on December 9, 2025, in Bengaluru, the conclave will showcase how AI is redefining the way networks, cloud, and edge systems are designed, optimized, and scaled for a hyperconnected world. Through keynote sessions, expert panels, and interactive discussions, participants will gain insights into:

  • The role of AI in shaping data center architecture, orchestration, and resource optimization
  • Emerging use cases across industries, from healthcare and manufacturing to mobility and entertainment
  • Ethical, regulatory, and security considerations in large-scale AI infrastructure
  • Collaborative innovation models and global standardization efforts

Additional sessions will focus on AI-driven debugging and optimization, data ingestion and software integration for scalable AI, and building secure digital foundations across cloud and edge environments.

“AI is rapidly becoming the backbone of digital transformation, and the ability to integrate intelligence into every layer of infrastructure will define the next decade of innovation,” said Sudhir Singh, Country Manager, Keysight India. “Through the AI Thought Leadership Conclave, Keysight is facilitating an exchange of ideas, showcasing AI-centered advancements, and shaping the connected future.”

In addition to focused discussions and technology presentations, the conclave will host an AI Technology Application Demo Fair, featuring live demonstrations of advanced solutions developed by Keysight and its technology partners. Attendees will also have ample opportunities to connect with industry leaders, participate in business and customer meetings, and engage in discussions with representatives from industry standard bodies.

The post Keysight Hosts AI Thought Leadership Conclave in Bengaluru appeared first on ELE Times.

Tektronix 516a beauty

Reddit:Electronics - Втр, 11/25/2025 - 22:14
Tektronix 516a beauty

Found this beauty for 30bucks ! The owner was an Thomson enginner 30years ago. Bit of dust inside, im planning to restore it ! Its huge ! Around 20kg !

submitted by /u/tx30840
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experimenting with step up converter and High voltage

Reddit:Electronics - Втр, 11/25/2025 - 19:28
experimenting with step up converter and High voltage

Hey everyone!

I've been diving into some high-voltage (HV) power electronics experiments recently. I wanted to share a project I've been tinkering with: a custom step-up converter.

We all know that step-up (Boost) circuits are excellent for boosting low-voltage inputs (like 12V), but I had a different idea: what if I use the Boost topology on an already high DC voltage?

My goal is to take a 100V DC input (or ∼167V DC if I rectify and filter a 120V AC line) and significantly boost it.

I'm currently deep in the simulation phase and plan to build a physical prototype soon. I'm looking for feedback from anyone experienced with HV DC/DC conversion on my approach.

here is the diagram for circuitJS:

txt $ 1 0.000005 3.046768661252054 50 5 43 5e-11 w 752 0 752 32 0 w 752 -32 752 -128 0 f 928 -16 752 -16 32 1.5 0.02 w 752 32 752 48 0 w 704 32 752 32 0 w 704 64 704 32 0 w 752 192 816 192 0 w 752 80 752 144 0 r 752 144 752 192 0 100 t 704 64 752 64 0 1 0 0 100 default g 560 192 528 192 0 0 w 752 192 688 192 0 r 816 -64 816 192 0 22 w 560 80 560 96 0 w 560 48 560 32 0 t 704 64 560 64 0 1 0 0 100 default w 560 192 688 192 0 r 688 144 688 192 0 100 r 560 144 560 192 0 100 w 560 96 560 112 0 w 624 96 560 96 0 w 624 128 624 96 0 t 624 128 560 128 0 1 0 0 100 default t 624 128 688 128 0 1 0 0 100 default r 560 -64 560 32 0 10000000 w 704 -64 704 -144 0 R 560 -64 512 -64 0 0 40 100 0 0 0.5 f 688 32 688 -64 40 1.5 0.02 l 560 -64 672 -64 0 0.1 0 0 d 672 -64 672 -128 2 default c 672 -128 560 -128 4 0.000009999999999999999 0.001 0.001 0.1 g 560 -128 528 -128 0 0 w 672 -128 752 -128 0 w 816 -128 816 -64 0 w 688 32 688 112 0 w 688 32 560 32 0 g 704 -144 704 -176 0 0 w 816 -128 752 -128 0 w 1088 0 1104 0 0 w 1040 0 1088 0 0 w 1088 -160 1088 0 0 r 1280 -160 1088 -160 0 3300 w 1280 -32 1280 -160 0 w 1280 -32 1232 -32 0 w 1232 -128 1232 -64 0 w 1168 -128 1232 -128 0 165 1104 -96 1120 -96 6 0 R 1040 -128 1008 -128 0 0 40 5 0 0 0.5 w 1040 -128 1168 -128 0 r 1040 0 1040 -128 0 1000000 g 1040 96 1040 112 0 0 c 1040 32 1040 96 4 3e-7 0.001 0.001 0 w 1040 32 1104 32 0 w 1040 0 1040 32 0 w 1280 -32 1280 192 0 w 1280 192 928 192 0 w 928 192 928 -16 0 w 1040 96 1200 96 0 w 1200 96 1200 64 0

submitted by /u/Inevitable-Round9995
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🚀 НАЗК запрошує студентів провести Урок «Доброчесність починається з мене» для учнів 6–9 класів

Новини - Втр, 11/25/2025 - 16:45
🚀 НАЗК запрошує студентів провести Урок «Доброчесність починається з мене» для учнів 6–9 класів
Image
kpi вт, 11/25/2025 - 16:45
Текст

🚀 НАЗК запрошує студентів провести Урок «Доброчесність починається з мене» для учнів 6–9 класів у межах Тижня доброчесності 2025.

Це шанс показати, що чесність – це сила, а не слабкість, і що один урок може запустити хвилю змін у країні.

Під час уроку ви:

Побачити реальне виробництво

Новини - Втр, 11/25/2025 - 16:20
Побачити реальне виробництво
Image
kpi вт, 11/25/2025 - 16:20
Текст

Екскурсії на виробництво є важливою складовою підготовки майбутніх фахівців: студенти ознайомлюються зі структурою підприємств, умовами та специфікою роботи на них, особливостями виробничого процесу, інноваційними технологіями та обладнанням, спілкуються з кваліфікованими спеціалістами.

A simpler circuit for characterizing JFETs

EDN Network - Втр, 11/25/2025 - 15:00

The circuit presented by Cor Van Rij for characterizing JFETs is a clever solution. Noteworthy is the use of a five-pin test socket wired to accommodate all of the possible JFET pinout arrangements.

This idea uses that socket arrangement in a simpler circuit. The only requirement is the availability of two digital multimeters (DMMs), which add the benefit of having a hold function to the measurements. In addition to accuracy, the other goals in developing this tester were:

  • It must be simple enough to allow construction without a custom printed circuit board, as only one tester was required.
  • Use components on hand as much as possible.
  • Accommodate both N- and P-channel devices while using a single voltage supply.
  • Use a wide range of supply voltages.
  • Incorporate a current limit with LED indication when the limit is reached.
The circuit

The resulting circuit is shown in Figure 1.

Figure 1 Characterizing JFETs using a socket arrangement. The fixture requires the use of two DMMs.

Wow the engineering world with your unique design: Design Ideas Submission Guide

Q1, Q2, R1, R3, R5, D2, and TEST pushbutton S3 comprise the simple current limit circuit (R4 is a parasitic Q-killer).

S3 supplies power to S1, the polarity reversal switch, and S2 selects the measurement. J1 and J2 are banana jacks for the DMM set to read the drain current. J3 and J4 are banana jacks for the DMM set to read Vgs(off). 

Note the polarities of the DMM jacks. They are arranged so that the drain current and Vgs(off) read correctly for the type of JFET being tested—positive IDSS and negative Vgs(off) for N-channel devices and negative IDSS and positive Vgs(off) for P-channel devices.

R2 and D1 indicate the incoming power, while R6 provides a minimum load for the current limiter. Resistor R8 isolates the DUT from the effects of DMM-lead parasitics, and R9 provides a path to earth ground for static dissipation.

Testing JFETs

Figure 2 shows the tester setup measuring Vgs(off) and IDSS for an MPF102, an N-channel device. The specified values of this device are Vgs(off) of -8v maximum and IDSS of 2 to 20 mA. Note that the hold function of the meters was used to maintain the measurements for the photograph. The supply for this implementation is a nominal 12-volt “wall wart” salvaged from a defunct router. 

Figure 2 The test of an MPF302 N-Channel JFET using the JFET characterization circuit.

Figure 3 shows the current limit in action by setting the N-JFET/P-JFET switch to P-JFET for the N-channel MPF102. The limit is 52.2 mA, and the I-LIMIT LED is brightly lit. 

Figure 3 The current limit test that sets the N-JFET/P-JFET switch to P-JFET for the N-channel MPF102.

John L. Waugaman’s love of electronics began when I built a crystal set at age 10 with my father’s help. Earning a BSEE from Carnegie-Mellon University led to a 30-year career in industry designing product inspection equipment and four patents. After being RIF’d, I spent the next 20 years as a consultant specializing in analog design in industrial and military projects. Now I’m retired, sort of, but still designing.  It’s in my blood, I guess.

Related Content

The post A simpler circuit for characterizing JFETs appeared first on EDN.

Gold-plated PWM-control of linear and switching regulators

EDN Network - Втр, 11/25/2025 - 15:00
“Gold-plated” without the gold plating

Alright, I admit that the title is a bit over the top. So, what do I mean by it? I mean that:

(1) The application of PWM control to a regulator does not significantly degrade the inherent DC accuracy of its output voltage,

(2) Any ability of the regulator’s output voltage to reach below that of its internal reference is supported, and

(3) This is accomplished without the addition of a new reference voltage.

Refer to Figure 1.

Figure 1 This circuit meets the requirements of “Gold-Plated PWM control” as stated above.

Wow the engineering world with your unique design: Design Ideas Submission Guide

How it works

The values of components Cin, Cout, Cf, and L1 are obtained from the regulator’s datasheet. (Note that if the regulator is linear, L1 is replaced with a short.)

The datasheet typically specifies a preferred value of Rg, a single resistor between ground and the feedback pin FB. 

Taking the DC voltage VFB of the regulator’s FB pin into account, R3 is selected so that U2a supplies a V_sup voltage greater than or equal to 3.0 V. C7 and R3 ensure that the composite is non-oscillatory, even with decoupling capacitor C6 in place.C6 is required for the proper operation of the SN74AC04 IC U1.

The following equations govern the circuit’s performance, where Vmax is the desired maximum regulator output voltage:

R3   = ( Vsup / VFB – 1 ) · 10k
Rg1 = Rg / ( 1 – ( VFB / Vsup ) / ( 1 – VFB/Vmax ))
Rg2 = Rg · Rg1 / ( Rg1 – Rg )
Rf = Rg · ( Vmax / VFB – 1 )

They enable the regulator output to reach zero volts (if it is capable of such) when the PWM inputs are at their highest possible duty cycle. 

U1 is part of two separate PWMs whose composite output can provide up to 16 bits of resolution. Ra and Rb + Rc establish a factor of 256 for the relative significance of the PWMs.

If eight bits or less of resolution is required, Rb and Rc, and the least significant PWM, can be eliminated, and all six inverters can be paralleled.

The PWMs’ minimum frequency requirements shown are important because when those are met, the subsequent filter passes a peak-to-peak ripple less than 2-16 of the composite PWM’s full-scale range. This filter consists of Ra, Rb + Rc, R5 to R7, C3 to C5, and U2b.

Errors

The most stringent need to minimize errors comes from regulators with low and highly accurate reference voltages. Let’s consider 600 mV and 0.5% from which we arrive at a 3-mV output error maximum inherent to the regulator. (This is overly restrictive, of course, because it assumes zero-tolerance resistors to set the output voltage. If 0.1% resistors were considered, we’d add 0.2% to arrive at 0.7% and more than 4 mV.)

Broadly, errors come from imperfect resistor ratios and component tolerances, op-amp input offset voltages and bias currents, and non-linear SN74AC04 output resistances. The 0.1% resistors are reasonably cheap.

Resistor ratios

If nominally equal in value, such resistors, forming a ratio, contribute a worst-case error of ± 0.1%. For those of different values, the worst is ± 0.2%. Important ratios involve:

  • Rg1, Rg2, and Rf
  • R3 and R4
  • Ra and Rb + Rc

Various Rf, Rg ratios are inherent to regulator operation.

The Rg1, Rg2; R3, R4; and Ra, Rb + Rc pairs have been introduced as requirements for PWM control.

The Ra / (Rb + Rc) error is ± 0.2%, but since this involves a ratio of 8-bit PWMs at most, it incurs less than 1 least significant bit (LSbit) of error.

The Rg1, Rg2 pair introduces an error of ±0.2 % at most.

The R3, R4 pair is responsible for a worst-case ±0.2 %. All are less than the 0.5% mentioned earlier.

Temperature drift

The OPA2376 has a worst-case input offset voltage of 25 µV over temperature. Even if U2a has a gain of 5 to convert FB’s 600 mV to 3 V, this becomes only 125 µV.

Bias current is 10-pA maximum at 25°C, but we are given a typical value only at 125°C of 250 pA.

Of the two op-amps, U2b sees the higher input resistance. But its current would have to exceed 6 nA to produce even 1-mV of offset, so these op-amps are blameless.

To determine U1’s output resistance, its spec shows that its minimum logic high voltage for a 3-V supply is 2.46 V under a 12-mA load. This means that the maximum for each inverter is 45 Ω, which gives us 9 Ω for five in parallel. (The maximum voltage drop is lower for a logic low 12 mA, resulting in a lower resistance, but we don’t know how much lower, so we are forced to worst-case it at a ridiculous 0 V!)

Counting C3 as a short under dynamic conditions, the five inverters see a 35-kΩ load, leading to a less than 0.03% error.

Wrapping up

The regulator and its output range might need an even higher voltage, but the input voltage IN has been required to exceed 3.2 V. This is because U1 is spec’d to swing to no further than 80 mV from its supply rails under loads of 2 kΩ or more. (I’ve added some margin, but it’s needed only for the case of maximum output voltage.)

You should specify Vmax to be slightly higher than needed so that U2b needn’t swing all the way to ground. This means that a small negative supply for U2 is unnecessary. IN must also be less than 5.5 V to avoid exceeding U2’s spec. If a larger value of IN is required by the regulator, an inexpensive LDO can provide an appropriate U2 supply.

I grant that this design might be overkill, but I wanted to see what might be required to meet the goals I set. But who knows, someone might find it or some aspect of it useful.

Christopher Paul has worked in various engineering positions in the communications industry for over 40 years.

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Government approves 17 projects worth Rs. 7,172 crore under ECMS

ELE Times - Втр, 11/25/2025 - 13:16

The Ministry of Electronics and IT announced for the clearance of 17 additional proposals, worth Rs. 7,172 crore under the Electronics Components Manufacturing Scheme (ECMS). The projects are expected to generate production worth Rs 65,111 crore and 11,808 direct jobs across the country, according to the ministry.

The approved projects are spread across 9 states from Jammu and Kashmir to Tamil Nadu, focusing on the government’s commitment towards a ‘balanced regional growth’ and creation of high-skill jobs beyond metropolitan clusters.

This approval focuses on developing key technologies used in various IT hardware, wearables, telecom, EVs, industrial electronics, defence, medical electronics, and renewable energy, like oscillators, enclosures, camera modules, connectors, Optical Transceiver (SFP), and multi-layered PCBs.

Minister of Electronics and IT, Ashwini Vaishnaw highlighted that the next phase of value chain integration is being unravelled, from devices to components and sub-assemblies which will ensure that India’s electronics sector reaches $500 billion in manufacturing value by 2030–31.

The Minister also launched the 1st Generation Energy-Efficient Edge Silicon Chip (SoC) (ARKA-GKT1), jointly developed by Cyient semiconductors Pvt Ltd and Azimuth AI along with the projects. The Platform-on-a-Chip SoC integrates advanced computing cores, hardware accelerators, power-efficient design, and secure sensing into a single chip, delivering up to 10x better performance while reducing cost and complexity. It supports smart utilities, cities, batteries, and industrial IoT, showcasing India’s shift toward a product-driven, high-performance semiconductor ecosystem.

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South Wales-based compound semiconductor cluster celebrates tenth anniversary

Semiconductor today - Втр, 11/25/2025 - 13:08
On 13 November, over 100 industry leaders, researchers, policymakers and educators gathered in Cardiff to celebrate the 10-year anniversary of CSconnected, the world’s first compound semiconductor cluster. This included reflections from founding figures, recognition of ‘Cluster Champions’, and a keynote address from Jack Sargeant MS, Wales’ Minister for Culture, Skills and Social Partnership, whose portfolio aligns with the cluster’s focus on talent pipelines and skills development...

Cornell upgrades lab with MOCVD system for next-gen nitride materials

Semiconductor today - Втр, 11/25/2025 - 11:22
A laboratory upgrade at Cornell University will help to forge new directions for nitride semiconductors by expanding their capabilities to support technologies such as quantum computers and next-generation radio-frequency and power devices...

BD Soft strengthens cybersecurity offerings for BFSI and Fintech businesses with advanced solutions

ELE Times - Втр, 11/25/2025 - 11:06

BD Software Distribution Pvt. Ltd. has expanded its Managed Detection and Response (MDR) and Data Loss Prevention (DLP) solutions for the BFSI and Fintech sectors amid rising cyber risks fuelled by digital banking growth and cloud-led transformation. The strengthened suite addresses vulnerabilities linked to sophisticated phishing and ransomware attacks, insecure third-party integrations, and increasing exposure of APIs and financial data across distributed environments.

BD Soft’s cybersecurity portfolio now includes solutions from leading global and Indian innovators; Axidian, headquartered in Dubai (UAE), for identity governance and privileged access management; FileCloud, based in Austin (USA), for hyper-secure EFSS (Enterprise File Sync & Share) capabilities; GTB Technologies, headquartered in California (USA), for advanced Data Loss Prevention (DLP); and Hunto.ai, based in Mumbai (India), for external threat intelligence and monitoring. Together, these solutions enable financial institutions to strengthen data governance, prevent fraud, meet regulatory obligations, and build resilient security frameworks that safeguard customer trust.

The surge in sector-wide threats is driven by the industry’s dependence on digital platforms and sensitive financial data. Over 60% of cyberattacks in India now target BFSI and Fintech, and cloud-related security incidents have risen by more than 45% in the last two years. With rapid mobile banking adoption expanding the attack surface, risks such as unauthorized access, data leakage, credential compromise, and insider-driven breaches continue to intensify, making continuous, intelligence-driven cyber defence essential for financial institutions today.

Commenting on the development, Mr. Zakir Hussain Rangwala, CEO, BD Software Distribution Pvt. Ltd., said, “As financial brands accelerate digital adoption, robust encryption, zero-trust architecture, and continuous monitoring are no longer optional, they are foundational to trust and financial stability. Our focus is enabling institutions to go not just digital, but safely digital.”

The post BD Soft strengthens cybersecurity offerings for BFSI and Fintech businesses with advanced solutions appeared first on ELE Times.

The role of AI processor architecture in power consumption efficiency

EDN Network - Втр, 11/25/2025 - 10:27

From 2005 to 2017—the pre-AI era—the electricity flowing into U.S. data centers remained remarkably stable. This was true despite the explosive demand for cloud-based services. Social networks such as Facebook, Netflix, real-time collaboration tools, online commerce, and the mobile-app ecosystem all grew at unprecedented rates. Yet continual improvements in server efficiency kept total energy consumption essentially flat.

In 2017, AI deeply altered this course. The escalating adoption of deep learning triggered a shift in data-center design. Facilities began filling with power-hungry accelerators, mainly GPUs, for their ability to crank through massive tensor operations at extraordinary speed. As AI training and inference workloads proliferated across industries, energy demand surged.

By 2023, U.S. data centers had doubled their electricity consumption relative to a decade earlier with an estimated 4.4% of all U.S. electricity now feeding data-center racks, cooling systems, and power-delivery infrastructure.

According to the Berkeley Lab report, data-center load growth has tripled over the past decade and is projected to double or triple again by 2028. The report estimates that AI workloads alone could by that time consume as much electricity annually as 22% of all U.S. households—a scale comparable to powering tens of millions of homes.

Total U.S. data-center electricity consumption increased ten-fold from 2014 through 2028. Source: 2024 U.S. Data Center Energy Usage Report, Berkeley Lab

This trajectory raises a question: What makes modern AI processors so energy-intensive? Whether rooted in semiconductor physics, parallel-compute structures, memory-bandwidth bottlenecks, or data-movement inefficiencies, understanding the causes becomes a priority. Analyzing the architectural foundations of today’s AI hardware may lead to corrective strategies to ensure that computational progress does not come at the expense of unsustainable energy demand.

What’s driving energy consumption in AI processors

Unlike traditional software systems—where instructions execute in a largely sequential fashion, one clock cycle and one control-flow branch at a time—large language models (LLMs) demand massively parallel elaboration of multiple-dimensional tensors. Matrices many gigabytes in size must be fetched from memory, multiplied, accumulated, and written back at amazing rates. In state-of-the-art models, this process encompasses hundreds of billions to trillions of parameters, each of which must be evaluated repeatedly during training.

Training models at this scale require feeding enormous datasets through racks of GPU servers running continuously for weeks or even months. While the computational intensity is extreme, so is the energy footprint. For example, the training run for OpenAI’s GPT-4 is estimated to have consumed around 50 gigawatt-hours of electricity. That’s roughly equivalent to powering the entire city of San Francisco for three days.

This immense front-loaded investment in energy and capital defines the economic model of leading-edge AI. Model developers must absorb stunning training costs upfront, hoping to recover them later through the widespread use of the inferred model.

Profitability hinges on the efficiency of inference, the phase during which users interact with the model to generate answers, summaries, images, or decisions. “For any company to make money out of a model—that only happens on inference,” notes Esha Choukse, a Microsoft Azure researcher who investigates methods for improving the efficiency of large-scale AI inference systems. His quote appeared in the May 20, 2025, MIT Technology Review article “We did the math on AI’s energy footprint. Here’s the story you haven’t heard.”

Indeed, experts across the industry consistently emphasize that inference not training is becoming the dominant driver of AI’s total energy consumption. This shift is driven by the proliferation of real-time AI services—millions of daily chat sessions, continuous content generation pipelines, AI copilots embedded into productivity tools, and ever-expanding recommender and ranking systems. Together, these workloads operate around the clock, in every region, across thousands of data centers.

As a result, it’s now estimated that 80–90% of all compute cycles serve AI inference. As models continue to grow, user demand accelerates, and applications diversify, further widening this imbalance. The challenge is no longer merely reducing the cost of training but fundamentally rethinking the processor architectures and memory systems that underpin inference at scale.

Deep dive into semiconductor engineering

Understanding energy consumption in modern AI processors requires examining two fundamental factors: data processing and data movement. In simple terms, this is the difference between computing data and transporting data across a chip and its surrounding memory hierarchy.

At first glance, the computational side seems conceptually straightforward. In any AI accelerator, sizeable arrays of digital logic—multipliers, adders, accumulators, activation units—are orchestrated to execute quadrillions of operations per second. Peak theoretical performance is now measured in petaFLOPS with major vendors pushing toward exaFLOP-class systems for AI training.

However, the true engineering challenge lies elsewhere. The overwhelming contributor to energy consumption is not arithmetic—it is the movement of data. Every time a processor must fetch a tensor from cache or DRAM, shuffle activations between compute clusters, or synchronize gradients across devices, it expends orders of magnitude more energy than performing the underlying math.

A foundational 2014 analysis by Professor Mark Horowitz at Stanford University quantified this imbalance with remarkable clarity. Basic Boolean operations require only tiny amounts of energy—on the order of picojoules (pJ). A 32-bit integer addition consumes roughly 0.1 pJ, while a 32-bit multiplication uses approximately 3 pJ.

By contrast, memory operations are dramatically more energy hungry. Reading or writing a single bit in a register costs around 6 pJ, and accessing 64 bits from DRAM can require roughly 2 nJ. This represents nearly a 10,000× energy differential between simple computation and off-chip memory access.

This discrepancy grows even more pronounced at scale. The deeper a memory request must travel—from L1 cache to L2, from L2 to L3, from L3 to high-bandwidth memory (HBM), and finally out to DRAM—the higher the energy cost per bit. For AI workloads, which depend on massive, bandwidth-intensive layers of tensor multiplications, the cumulative energy consumed by memory traffic considerably outstrips the energy spent on arithmetic.

In the transition from traditional, sequential instruction processing to today’s highly parallel, memory-dominated tensor operations, data movement—not computation—has emerged as the principal driver of power consumption in AI processors. This single fact shapes nearly every architectural decision in modern AI hardware, from enormous on-package HBM stacks to complex interconnect fabrics like NVLink, Infinity Fabric, and PCIe Gen5/Gen6.

Today’s computing horsepower: CPUs vs. GPUs

To gauge how these engineering principles affect real hardware, consider the two dominant processor classes in modern computing:

  • CPUs, the long-standing general-purpose engines of software execution
  • GPUs, the massively parallel accelerators that dominate AI training and inference today

A flagship CPU such as AMD’s Ryzen Threadripper PRO 9995WX (96 cores, 192 threads) consumes roughly 350 W under full load. These chips are engineered for versatility—branching logic, cache coherence, system-level control—not raw tensor throughput.

AI processors, in contrast, are in a different league. Nvidia’s latest B300 accelerator draws around 1.4 kW on its own. A full Nvidia DGX B300 rack unit, housing eight accelerators plus supporting infrastructure, can reach 14 kW. Even in the most favorable comparison, this represents a 4× increase in power consumption per chip—and when comparing full server configurations, the gap can expand to 40× or more.

Crucially, these raw power numbers are only part of the story. The dramatic increases in energy usage are multiplied by AI deployments in data centers where tens of thousands of such GPUs are running around the clock.

Yet hidden beneath these amazing numbers lies an even more consequential industry truth, rarely discussed in public and almost never disclosed by vendors.

The well-kept industry secret

To the best of my knowledge, no major GPU or AI accelerator vendor publishes the delivered compute efficiency of their processors defined as the ratio of actual throughput achieved during AI workloads to the chip’s theoretical peak FLOPS.

Vendors justify this absence by noting that efficiency depends heavily on the software workload; memory access patterns, model architecture, batch size, parallelization strategy, and kernel implementation can all impact utilization. This is true, and LLMs place extreme demands on memory bandwidth causing utilization to drop substantially.

Even acknowledging these complexities, vendors still refrain from providing any range, estimate, or context for typical real-world efficiency. The result is a landscape where theoretical performance is touted loudly, while effective performance remains opaque.

The reality, widely understood among system architects but seldom stated plainly is simple: “Modern GPUs deliver surprisingly low real-world utilization for AI workloads—often well below 10%.”

A processor advertised at 1 petaFLOP of peak AI compute may deliver only ~100 teraFLOPS of effective throughput when running a frontier-scale model such as GPT-4. The remaining 900 teraFLOPS are not simply unused—they are dissipated as heat requiring extensive cooling systems that further compound total energy consumption.

In effect, much of the silicon in today’s AI processors is idle most of the time, stalled on memory dependencies, synchronization barriers, or bandwidth bottlenecks rather than constrained by arithmetic capability.

This structural inefficiency is the direct consequence of the imbalance described earlier: arithmetic is cheap, but data movement is extraordinarily expensive. As models grow and memory footprints balloon, this imbalance worsens.

Without a fundamental rethinking of processor architecture—and especially of the memory hierarchy—the energy profile of AI systems will continue to scale unsustainably.

Rethinking AI processors

The implications of this analysis point to a clear conclusion: the architecture of AI processors must be fundamentally rethought. CPUs and GPUs each excel in their respective domains—CPUs in general-purpose control-heavy computation, GPUs in massively parallel numeric workloads. Neither was designed for the unprecedented data-movement demands imposed by modern large-scale AI.

Hierarchical memory caches, the cornerstone of traditional CPU design, were originally engineered as layers to mask the latency gap between fast compute units and slow external memory. They were never intended to support the terabyte-scale tensor operations that dominate today’s AI workloads.

GPUs inherited versions of these cache hierarchies and paired them with extremely wide compute arrays, but the underlying architectural mismatch remains. The compute units can generate far more demand for data than any cache hierarchy can realistically supply.

As a result, even the most advanced AI accelerators operate at embarrassingly low utilization. Their theoretical petaFLOP capabilities remain mostly unrealized—not because the math is difficult, but because the data simply cannot be delivered fast enough or close enough to the compute units.

What is required is not another incremental patch layered atop conventional designs. Instead, a new class of AI-oriented processor architecture must emerge, one that treats data movement as the primary design constraint rather than an afterthought. Such architecture must be built around the recognition that computation is cheap, but data movement is expensive by orders of magnitude.

Processors of the future will not be defined by the size of their multiplier arrays or peak FLOPS ratings, but by the efficiency of their data pathways.

Lauro Rizzatti is a business advisor at VSORA, a company offering silicon solutions for AI inference. He is a verification consultant and industry expert on hardware emulation.

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The post The role of AI processor architecture in power consumption efficiency appeared first on EDN.

Created a parallel serial adapter for a dot matrix printer

Reddit:Electronics - Втр, 11/25/2025 - 09:48
Created a parallel serial adapter for a dot matrix printer

Went to a local electronics store to buy some knobs and things, I mentioned dot matrix printers to an employee and he pulled one out of his butt (the back of the store) and gave it to me for free!

Felt like I had to make the serial connector myself to go with the retro feel, so I did!

submitted by /u/cstrlib
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Advancing Quantum Computing R&D through Simulation

ELE Times - Втр, 11/25/2025 - 09:47

Courtesy: Synopsys

Even as we push forward into new frontiers of technological innovation, researchers are revisiting some of the most fundamental ideas in the history of computing.

Alan Turing began theorizing the potential capabilities of digital computers in the late 1930s, initially exploring computation and later the possibility of modeling natural processes. By the 1950s, he noted that simulating quantum phenomena, though theoretically possible, would demand resources far beyond practical limits — even with future advances.

These were the initial seeds of what we now call quantum computing. And the challenge of simulating quantum systems with classical computers eventually led to new explorations of whether it would be possible to create computers based on quantum mechanics itself.

For decades, these investigations were confined within the realms of theoretical physics and abstract mathematics — an ambitious idea explored mostly on chalkboards and in scholarly journals. But today, quantum computing R&D is rapidly shifting to a new area of focus: engineering.

Physics research continues, of course, but the questions are evolving. Rather than debating whether quantum computing can outpace classical methods — it can, in principle — scientists and engineers are now focused on making it real: What does it take to build a viable quantum supercomputer?

Theoretical and applied physics alone cannot answer that question, and many practical aspects remain unsettled. What are the optimal materials and physical technologies? What architectures and fabrication methods are needed? And which algorithms and applications will unlock the most potential?

As researchers explore and validate ways to advance quantum computing from speculative science to practical breakthroughs, highly advanced simulation tools — such as those used for chip design — are playing a pivotal role in determining the answers.

Pursuing quantum utility

In many ways, the engineering behind quantum computing presents even more complex challenges than the underlying physics. Generating a limited number of “qubits” — the basic units of information in quantum computing — in a lab is one thing. Building a large-scale, commercially viable quantum supercomputer is quite another.

A comprehensive design must be established. Resource requirements must be determined. The most valuable and feasible applications must be identified. And, ultimately, the toughest question of all must be answered: Will the value generated by the computer outweigh the immense costs of development, maintenance, and operation?

The latest insights were detailed in a recent preprint, “How to Build a Quantum Supercomputer: Scaling from Hundreds to Millions of Qubits, by Mohseni et. al. 2024,” which I helped co-author alongside Synopsys principal engineer John Sorebo and an extended group of research collaborators.

Increasing quantum computing scale and quality

Today’s quantum computing research is driven by fundamental challenges: scaling up the number of qubits, ensuring their reliability, and improving the accuracy of the operations that link them together. The goal is to produce consistent and useful results across not just hundreds, but thousands or even millions of qubits.

The best “modalities” for achieving this are still up for debate. Superconducting circuits, silicon spins, trapped ions, and photonic systems are all being explored (and, in some cases, combined). Each modality brings its own unique hurdles for controlling and measuring qubits effectively.

Numerical simulation tools are essential in these investigations, providing critical insights into how different modalities can withstand noise and scale to accommodate more qubits. These tools include:

  • QuantumATK for atomic-scale modeling and material simulations.
  • 3D High Frequency Simulation Software (HFSS) for simulating the planar electromagnetic crosstalk between qubits at scale.
  • RaptorQu for high-capacity electromagnetic simulation of quantum computing applications.

Advancing quantum computing R&D with numerical simulation

The design of qubit devices — along with their controls and interconnects — blends advanced engineering with quantum physics. Researchers must model phenomena ranging from electron confinement and tunnelling in nanoscale materials to electromagnetic coupling across complex multilayer structures

Many issues that are critical for conventional integrated circuit design and atomic-scale fabrication (such as edge roughness, material inhomogeneity, and phonon effects) must also be confronted when working with quantum devices, where even subtle variations can influence device reliability. Numerical simulation plays a crucial role at every stage, helping teams:

  • Explore gate geometries.
  • Optimize Josephson junction layouts.
  • Analyze crosstalk between qubits and losses in superconducting interconnects.
  • Study material interfaces that impact performance.

By accurately capturing both quantum-mechanical behavior and classical electromagnetic effects, simulation tools allow researchers to evaluate design alternatives before fabrication, shorten iteration cycles, and gain deeper insight into how devices operate under realistic conditions.

Advanced numerical simulation tools such as QuantumATK, HFSS, and RaptorQu are transforming how research groups approach computational modeling. Instead of relying on a patchwork of academic codes, teams can now leverage unified environments — with common data models and consistent interfaces — that support a variety of computational methods. These industry-grade platforms:

  • Combine reliable yet flexible software architectures with high-performance computational cores optimized for multi-GPU systems, accessible through Python interfaces that enable programmable extensions and custom workflows.
  • Support sophisticated automated workflows in which simulations are run iteratively, and subsequent steps adapt dynamically based on intermediate results.
  • Leverage machine learning techniques to accelerate repetitive operations and efficiently handle large sets of simulations, enabling scalable, data-driven research.

Simulation tools like QuantumATK, HFSS, and RaptorQu are not just advancing individual research projects — they are accelerating the entire field, enabling researchers to test new ideas and scale quantum architectures more efficiently than ever before. With Ansys now part of Synopsys, we are uniquely positioned to provide end-to-end solutions that address both the design and simulation needs of quantum computing R&D.

Empowering quantum researchers with industry-grade solutions

Despite the progress in quantum computing research, many teams still rely on disjointed, narrowly scoped open-source simulation software. These tools often require significant customization to support specific research needs and generally lack robust support for modern GPU clusters and machine learning-based simulation speedups. As a result, researchers and companies spend substantial effort adapting and maintaining fragmented workflows, which can limit the scale and impact of their numerical simulations.

In contrast, mature, fully supported commercial simulation software that integrates seamlessly with practical workflows and has been extensively validated in semiconductor manufacturing tasks offers a clear advantage. By leveraging such platforms, researchers are freed to focus on qubit device innovation rather than spending time on infrastructure challenges. This also enables the extension of numerical simulation to more complex and larger-scale problems, supporting rapid iteration and deeper insight.

To advance quantum computing from research to commercial reality, the quantum ecosystem needs reliable, comprehensive numerical simulation software — just as the semiconductor industry relies on established solutions from Synopsys today. Robust, scalable simulation platforms are essential not only for individual projects but for the growth and maturation of the entire quantum computing field.

“Successful repeatable tiles with superconducting qubits need to minimize crosstalk between wires, and candidate designs are easier to compare by numerical simulation than in lab experiments,” said Qolab CTO John Martinis, who was recently recognized by the Royal Swedish Academy of Sciences for his groundbreaking work in quantum mechanics. “As part of our collaboration, Synopsys enhanced electromagnetic simulations to handle increasingly complex microwave circuit layouts operating near 0K temperature. Simulating future layouts optimized for quantum error-correcting codes will require scaling up performance using advanced numerical methods, machine learning, and multi-GPU clusters.”

The post Advancing Quantum Computing R&D through Simulation appeared first on ELE Times.

Overcoming BEOL Patterning Challenges at the 3-NM Node

ELE Times - Втр, 11/25/2025 - 09:16

Courtesy: Lam Research

● Controlling critical process parameters is key to managing edge placement error (EPE)

● Simulations revealed that only 9.75% of runs met the minimum line CD success criteria

As the complementary metal-oxide semiconductor (CMOS) area shrinks 50% from one node to the next, interconnect critical dimensions (CD) and pitch (or spacing) are under tight demands.

At the N3 node, where metal pitch dimensions must be at or below 18 nm,1,2 one of main interconnect challenges is securing sufficient process margins for CD and edge placement error (EPE).

  • Achieving the CD gratings for future technology nodes requires multi-patterning approaches, such as self-aligned double/quadruple/octuple patterning (SADP/SAQP/SAOP) and multiple litho-etch (LE) patterning, combined with 193i lithography or even EUV lithography.

SEMulator3D virtual fabrication, part of Semiverse Solutions, was used in a Design of Experiments (DOE) to evaluate EPE and demonstrate the ability to successfully pattern an advanced 18- and 16-nm metal pitch (MP) BEOL.

Using a process model, we explored the impact of process variations and patterning sensitivities on EPE variability. The simulation identified significant process parameters and corresponding process windows that need to be controlled for successful EPE control.

Simulation of 18-nm BEOL Process

A self-aligned litho-etch litho-etch (SALELE) scheme with self-aligned blocks was proposed for an 18-nm MP BEOL process flow used at the N3 node. The advantage of this scheme is that no dummy metal is used in the BEOL, which helps reduce parasitic capacitance.

Figure 2 highlights the selected process parameters and corresponding range values used in the DOE simulation. Multiple process parameters that could affect the dimensions of the lines and blocks were varied during simulation using a uniform Monte Carlo distribution.

Parameters such as BL1 Litho bias and LE2 overlay, with range of variation. Simulation results included EPE simulations and Minimum line CD calculation.

In this study, three challenging EPE measurements were evaluated:

  1. EPE1: EPE calculation of the gap between the printed silicon mandrels for litho etch 1 (LE1) and printed silicon oxycarbide lines for litho etch 2 (LE2)
  2. EPE2: EPE calculation of the gap between the printed BL1 (block 1) mask after BL1 etch and printed LE1 lines
  3. EPE3: EPE calculation of the gap between the printed BL2 (block 2) mask after BL2 etch and the printed LE2 lines

Monte Carlo simulations were performed in SEMulator3D across 800 runs using a uniform distribution. For each simulation event, the EPE was extracted using virtual measurements. Process sensitivity analysis was performed in the simulation to investigate the impact of process variations (Figure 2) on the EPE challenges.

The most important process parameters that could impact line dimensions and EPE were automatically identified using the SEMulator3D® Analytics module. Process sensitivity analysis was performed to explore the impact of the most significant parameters on each EPE challenge.

DOE Results

Figure 3 displays an EPE sensitivity analysis plot of EPE1: LE2 on LE1. Spacer thickness defines the gap between the LE2 and LE1 line segments. EPE1 is significantly dependent on spacer thickness variation and less sensitive to LE1 and LE2 litho bias variations.

Three graphs and corresponding virtual representations:-

The same EPE sensitivity analysis methodology used in Figure 3 was applied to EPE2 and EPE3. The process sensitivity analysis plots of EPE allowed us to identify acceptable process windows for all three (EPE1, EPE2, and EPE3).

Figure 4 summarizes EPE process windows that were extracted from our process model for the significant process parameters identified earlier.

EPE sensitivity analysis with the extracted process window for all important parameters such as spacer thickness, LE1 litho bias, and BL1 litho bias

Along with evaluating process windows needed to avoid the EPE challenges, minimum line CD was virtually measured for each simulated run. Figure 5 depicts the minimum line CD process window needed to meet the line CD success criteria (8nm<CD<10nm).

Our simulation results indicated that only 9.75% of runs displayed a minimum line CD between 8 and 10 nm. Thus, in addition to the EPE challenge, minimum line CD control is critical and should be considered as part of the process window definition.

Dots on a graph showing a concentration of runs below 10 nm for minimum CD

This study demonstrates that virtual fabrication is a powerful tool for identifying process windows and margins essential for next-generation interconnect technologies. By simulating and analyzing critical process parameters, engineers can proactively address yield-limiting failures and optimize both minimum line CD and EPE control. These insights are vital for advancing semiconductor manufacturing at the 3-nm node and beyond.

The post Overcoming BEOL Patterning Challenges at the 3-NM Node appeared first on ELE Times.

Driving Innovation with High-Performance but Low-Power Multi-Core MCUs

ELE Times - Втр, 11/25/2025 - 08:56

Courtesy: Renesas

Over the last decade, the number of connected Internet of Things (IoT) devices has grown exponentially across markets, ranging from medical devices and smart homes to industrial automation. These smart, connected endpoints implement complex and compute-intensive applications; run real-time control loops; analyze large amounts of data; integrate sophisticated graphics and user interfaces; and run advanced protocols to communicate with the cloud. Machine learning has enabled voice and vision AI capabilities at the edge, empowering devices to make intelligent decisions and trigger actions without cloud intervention. This reduces latency and power consumption, saves bandwidth, and increases privacy. Advanced security has also become an integral part of these systems, as users demand advanced cryptographic accelerators on-chip, robust system isolation, and security for data at rest as well as in motion. Applications also require lower power and fast wake-up times to prolong battery life and reduce overall system power consumption.

These new and emerging requirements drive the need for greater processing power in embedded systems. Fast, reliable, and low-power non-volatile storage of code and data is also needed for the implementation of these sophisticated applications. Traditional systems used either powerful MPUs or multiple MCUs to perform these functions. Recently, we are seeing the emergence of high-performance multi-core MCUs with performance approaching that of MPUs – some with hardware AI accelerators – that can handle all these functions with a single chip. These high-performance MCUs provide a powerful alternative to MPUs for applications where power consumption and cost are critical concerns. MCUs have several advantages over MPUs that make them particularly well-suited for these power-sensitive IoT applications – better real-time performance, integration of power management and non-volatile memory, single voltage rail, lower power, typically lower cost, and ease of use.

The need for higher performance and functionality while keeping power and costs low has driven the movement towards the use of finer process technology nodes like 28nm or 22nm. This movement has driven innovations in embedded memory technology, since embedded flash does not scale well below 40nm. Alternative memory technologies like Magnetoresistive Random Access Memory (MRAM) are being used to replace embedded flash for non-volatile storage. A number of silicon manufacturers like TSMC now provide embedded MRAM that can be integrated into an MCU.

Performance and System Design Flexibility with Dual-Core MCUs

The single-core RA8M2 and RA8D2 MCUs feature the Cortex-M85 core running up to 1GHz, with Helium vector extensions to enable compute-intensive applications. On the dual-core option, a second Cortex-M33 core is added to allow efficient system partitioning, lower power wake-up, and operation. Either core can be configured to be a master or slave CPU and can be independently powered. Inter-processor communication is through flags, interrupts, and message FIFOs.

Dual-core MCUs significantly enhance the performance of IoT applications by enabling greater processing power, efficient task partitioning between the two cores, and improved real-time performance. System tasks can be assigned to different cores, leading to concurrent and more efficient system operation. One core can handle real-time control tasks, sensor interfaces, and communications, while the other, typically a higher-performance core, can handle the compute-intensive tasks, such as execution of neural network model operators, pre-processing of audio or image data, graphics, or motor control. This partitioning between the two cores can enable faster execution and overall improvement in system performance.

With optimal system task partitioning, dual cores can enable lower power consumption. Each core can be independently controlled, allowing them to run at frequencies optimal for the assigned tasks. The lower-performance Cortex-M33 core can be the housekeeping CPU, which enables low-power wake-up and operation. The higher-performance core can stay in low-power mode most of the time to be woken up only when high-performance processing is required. This segregation of tasks with the appropriate use of MCU resources results in overall lower system power consumption.

Dual cores also enable more robust system design. The high-compute tasks can be separated from the more time-critical and safety-critical tasks and real-time control loops, thus allowing a more robust system design. Any interruption on one core will not have an impact on the tasks of the second core. Dual cores can also enable functional safety with core isolation, redundancy, and optimal resource usage by safety-critical and non-critical tasks.

Performance and Power Efficiency with Embedded MRAM

The move to lower process geometries has opened the doors to newer memory alternatives to flash, such as MRAM, which is making its entry into the embedded space as embedded MRAM (eMRAM) and is now included on the RA8M2 and D2 MCUs.

As MCU manufacturers scale to higher performance and functionality with finer process geometries, eMRAM is increasingly being used to replace embedded flash as the non-volatile memory of choice. One key factor that is making MRAM a viable option for use on MCUs is its ability to retain data through solder reflow, which allows the devices to be pre-programmed prior to being soldered on the board. One additional advantage is that MRAM can be used to replace not just the embedded flash (for code) but also SRAM (for data storage) due to the byte addressability (except in cases with security concerns with retention of data across power cycles). Embedded MRAM is now supported by major silicon foundries, which allow MCU manufacturers to incorporate MRAM into new chip designs with minimal cost overhead.

Special care needs to be taken to prevent MRAM from being corrupted by external magnetic fields present in close proximity to the device. MCU manufacturers typically specify magnetic immunity in idle, power off, and operational modes. In order to avoid corruption of MRAM bits, designers will need to provide adequate spacing between an external magnetic field source and the MRAM-based device, so as not to exceed this magnetic immunity specification. Shielding the MRAM with specialized materials is another option to protect the MRAM from a strong magnetic field.

Key Advantages of MRAM Technology:

  • True random access non-volatile memory with higher endurance and retention as compared to flash
  • Faster write speeds as compared to flash, with no erase needed
  • Byte-addressable and simpler to access than flash, similar to SRAM, improving both performance and power
  • No leakage when in standby, making them much lower power than SRAM
  • Reads are non-destructive and do not need to be refreshed, so it is an alternative to DRAM
  • Magnetic layers are not susceptible to radiation, similar to flash
  • Fewer mask layers are needed for MRAM as compared to flash, thus lowering costs
  • Scales well for lower process technology nodes and, as such, provides a viable alternative to embedded flash

MRAM Applications

MRAM’s low power and non-volatile characteristics make it ideal for various IoT applications as a unified memory, replacing embedded flash, SRAM, or battery-backed SRAM. It can also be used to replace DRAM for data logging applications that require high density, low power, and non-volatile data storage. The immunity to radiation makes it ideal for medical applications in clinical settings and space applications. MRAM can also be used in industrial control and robotics, data center, and smart grid applications, for real-time data storage, fast data retrieval, and replacing battery backup SRAM.

Not forgetting the Edge AI market using machine learning – here, the MRAM can be used to store the AI neural network models and weights, which are retained across power cycles and do not need to be reloaded for execution each time. MRAM, with its fast read/writes, low power, and high endurance, is particularly suited for these applications requiring high processing performance.

In summary, the new and emerging use cases drive the need for high-performance and specialized feature sets on MCUs. Powerful CPU cores, multi-core architecture, new memory technologies like MRAM, and rich peripherals are integrated on RA8M2 and RA8D2 MCUs to support the needs of these cutting-edge applications.

 

The post Driving Innovation with High-Performance but Low-Power Multi-Core MCUs appeared first on ELE Times.

Evolving from IoT to edge AI system development

ELE Times - Втр, 11/25/2025 - 08:38

Courtesy: Avnet

The advancement of machine learning (ML) along with continued breakthroughs in artificial intelligence (AI) are funnelling billions of dollars into cutting-edge research and advanced computing infrastructure. In this high-stakes atmosphere, embedded developers face challenges with the evolution of Internet of Things (IoT) devices. Teams must now consider how to implement ML and edge AI into IoT systems.

Connected devices at the edge of the network can be divided into two broad categories: gateways and nodes. Gateways (including routers) have significant computing and memory resources, wired power and reliable high-bandwidth connectivity. Edge nodes are much smaller devices with constrained resources. They include smartphones, health wearables, and environmental monitors. These nodes have limited (often battery) power and may have limited or intermittent connectivity. Nodes are often the devices that provide real-time responses to local stimuli.

Most edge AI and ML applications will fall into these two categories. Gateways have the capacity to become more complex, enabled by access to resources such as wired power. What we currently call IoT nodes will also evolve functionally, but are less likely to benefit from more resources. This evolution is inevitable, but it has clear consequences on performance, energy consumption, and, fundamentally, the design.

Is edge AI development more challenging than IoT?

There are parallels between developing IoT devices and adopting edge AI or ML. Both involve devices that will be installed in arbitrary locations and unattended for long periods of time. Data security and the cost of exposure are already key considerations in IoT when handling sensitive information. Edge gateways and nodes retain more sensitive data on-device, but that doesn’t eliminate the need for robust security. Beyond their size and resources, there are significant differences between the two paradigms, as outlined in the table.

Comparing IoT and edge AI applications

Aspect IoT Embedded System Edge AI Embedded System
Data Processing Cloud-based Local/on-device
Intelligence Location Centralized (cloud/server) Decentralized (embedded device)
Latency High (depends on network) Very low/real-time
Security Risks Data exposed in transit On-device privacy, device-level risks
Application Scope Large networks, basic data Local analytics, complex inference
Hardware Optimization For connectivity, sensing For AI model runtime, acceleration

What’s at stake in edge AI?

IoT devices are data-centric, providing local control along with actionable data that is typically passed to a cloud application. AI and ML at the edge replace cloud dependency with local inferencing. Any AI/ML application starts with sourcing and validating enough data to train a model that can infer meaningful and useful insights.

Once the data is gathered and the source model has been trained, its operation must be optimized through processes such as model pruning, distillation and quantization, to drive simpler inference algorithms on more limited edge AI hardware.

Every time a new set of model parameters is passed to the edge AI device, the investment in training is at risk. Every time an edge node delivers a result based on local inference, it reveals information about the local model. Edge AI devices are also open to physical tampering, as well as adversarial attacks intended to corrupt their operation or even poison the inferencing models they rely upon.

Adaptive models and federated learning

While IoT devices can be maintained using over-the-air (OTA) updates, edge AI systems use adaptive models to adjust their inferencing algorithms and decision-making processes locally in response to external stimuli. This adaptation is valuable because it helps systems deliver resilient performance in evolving situations, such as predictive maintenance for manufacturing processes or patient monitoring in healthcare devices.

Adaptive models also enable edge AI devices to evolve functionally without exposing input data or output decisions. Over time, a source model implemented on an edge AI device should become steadily more valuable as it adapts to real-world stimuli.

This value becomes more apparent when adaptive models are used as part of a federated learning strategy. While edge AI devices using adaptive models keep their learning to themselves, under federated learning strategies, they share.

Each edge AI device adapts its model to better serve its local situation and then, periodically, sends its updated model parameters to the cloud. The submitted parameters are averaged and used to update the source model to reflect this experience. The upside is a source model that is regularly enhanced by field experience from multiple contexts. The challenge is that increasingly valuable model parameters must traverse a network, making them vulnerable to theft or misuse.

Balancing security and model performance

Security measures, such as encryption, help protect model parameters but may be at odds with the design goal of creating a low-resource, highly responsive edge AI device. This challenge can be made more difficult by some strategies used to compress source models to run on low-resource devices.

For example, quantization works by reducing the resolution with which model parameters are expressed, for example, from 32-bit floating-point representations during training to 8- or even 4-bit integers in the compressed version. Pruning disregards nodes whose parameters have a negligible influence on the rest of the model. Distillation implements “teacher–pupil” learning, in which the embedded model learns by relating the inputs and outputs of the source model.

Each of these techniques simplifies the model and makes it more practical for running on resource-constrained hardware, but at the cost of protection against security challenges. For example, quantized or pruned models may offer less redundancy than the source model, making them more efficient, but leave them less resilient to adversarial attacks.

The implementation of security features, such as encrypted parameter storage and communication, or periodic re-authentication, can create processing overheads that undercut the gains achieved by model compression. As the value at risk in edge AI devices rises, embedded engineers will need to weave security concerns more deeply into their development processes. For example, pruning strategies may have to be updated to include “adversarial pruning” in which different parts of a model are removed to see what can be discarded without making the remainder more vulnerable.

Keeping edge AI systems up to date

Embedded edge AI developers will need to be extremely flexible to accommodate rapidly changing ML algorithms, rapidly evolving AI processor options, and the challenge of making the hardware and software work together.

On the hardware side, multiple semiconductor start-ups have been funded to develop edge AI chips. Although the architectures differ, the design goals are often similar:

  • Minimize data movement during computation to save power
  • Implement extremely efficient arrays of multipliers to do the matrix math involved in ML inference
  • Wrap the inferencing engine up in an appropriate set of peripherals for the end application

On the algorithmic side, although ML inferencing involves many standard operations, such as calculating weights and biases in layers or handling back-propagation, the exact way these operations are deployed is evolving rapidly.

Not every combination of ML operations will run well on every processor architecture, especially if the toolchains provided for new chips are immature.

The verification challenge

Design verification may also be a challenge, especially in situations where the implementation of security forces changes to the inferencing models, to the point that they must be retrained, retested and revalidated.

This may be especially important in highly regulated sectors such as healthcare and automotive. Engineers may have to rely heavily on hardware-in-the-loop testing to explore real-world performance metrics such as latency, power, accuracy, and resilience that have been formulated during the development process.

Embedded system designers must be ready to adapt rapidly. Edge AI algorithms, hardware strategies and security issues threatening efficacy are all evolving simultaneously. For edge AI devices, the well-understood challenges of IoT device design will be overlaid with concerns about the value of AI data at rest and on the move.

The impact of security features on inferencing performance must be balanced with the rate of progress in the field. Embedded AI system designers should mitigate these challenges by adhering to standards, choosing established toolchains where possible, and picking well-proven tools to handle issues such as scalable deployment and lifecycle management.

The post Evolving from IoT to edge AI system development appeared first on ELE Times.

From the grid to the gate: Powering the third energy revolution

ELE Times - Втр, 11/25/2025 - 08:25

Courtesy: Texas Instruments

A significant change is unfolding before us. In the 18th and 19th centuries, the Great Britain used coal to power the Industrial Revolution, propelling the transition to machine manufacturing – the first energy revolution. Next, came the second energy revolution, in the United States, where the oil boom of the 20th century fuelled unprecedented advancements in vehicles and electricity.

Today, artificial intelligence (AI) is ushering in the third energy revolution through its rapid growth. Focus is changing on the the generation, conversion, and distribution of the energy needed to power the massive amounts of data we’re consuming. Today, the biggest question is, ‘how to generate the necessary energy required to power data centers and how to efficiently move that energy down the power path – from the grid to the gates of the processors’, which is quickly becoming the most exciting challenge of our times.

Changing distribution levels

As the computing power required by AI data centers scales, data center architectures are undergoing a major change. Typically, servers stack on top of each other in data center computing racks, with power-supply units (PSUs) at the bottom. Alternating current (AC) is distributed to every server rack, where a PSU converts it to 48V and then down to 12V. Point-of-load converters in the server then take it down to the processor gate core voltages.

With the advent of generative AI and the subsequent addition of more servers to process information, racks now need significantly more power. For example, entering a question into a large language model (LLM) requires 10 times the amount of power as entering the same question into a search engine. These increased power levels are pushing power architectures to the limit.

Meeting power demands with solar energy

As data centers require more power to support growing and evolving workloads, renewable energy might just be the answer. Solar is becoming an increasingly viable and affordable energy source in many parts of the world. Coincidentally, data center customers are committing to 100% renewable energy within their companies, and this commitment must be reflected in the data centers they use. Solar can not only help data center customers meet their sustainability goals, but also offers a fast way to deploy more energy generation.

Semiconductors are at the center of the solar power conversion process, making these technologies key to meeting data center power demands. Efficient power conversion and accurate sensing technologies are crucial to making solar a reliable source of energy for the grid.

Energy storage to maximize solar output

Even though data centers operate every hour of every day, solar energy is only available during day time. So how will solar energy help power data centers when the sun isn’t shining? That’s where battery energy storage systems (ESS) become a critical piece of the puzzle, making sure the energy is available and can be used at any time when needed.

Batteries are already an essential component of the grid, effectively storing and releasing large amounts of electricity throughout the grid, and now they’re being used specifically for data centers. Battery management systems within an ESS directly monitor battery cells and assess the amount of energy within, measuring the voltage and determining the state of charge and state of health of the battery to help ensure there is the necessary power available.

In the age of artificial intelligence, data is the new currency, and it’s more valuable than ever. As such, something must power – and sustain – it. We used coal to kickstart factories, and oil to advance automobiles, and now, renewable energy can help us address the growing power needs of data centers in the future.

The post From the grid to the gate: Powering the third energy revolution appeared first on ELE Times.

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